Multi-Hit SFX using MHz XFEL sources
Serial Crystallography (SX)
Starting Model(s)
| Initial Refinement Model(s) |
|---|
| Type | Source | Accession Code | Details |
|---|
|
experimental model | PDB | 6FTR | |
Crystallization
| Crystalization Experiments |
|---|
| ID | Method | pH | Temperature | Details |
|---|
| 1 | BATCH MODE | 3.5 | 293 | NaCl, ethylene glycol, PEG 3350, acetate buffer pH 3.5 |
| Crystal Properties |
|---|
| Matthews coefficient | Solvent content |
|---|
| 2.07 | 40.56 |
Crystal Data
| Unit Cell |
|---|
| Length ( Å ) | Angle ( ˚ ) |
|---|
| a = 79.3 | α = 90 |
| b = 79.3 | β = 90 |
| c = 37.73 | γ = 90 |
| Symmetry |
|---|
| Space Group | P 43 21 2 |
|---|
Diffraction
| Diffraction Experiment |
|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|
| 1 | 1 | x-ray | 293 | PIXEL | AGIPD | | 2017-09-14 | M | SINGLE WAVELENGTH |
| Radiation Source |
|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|
| 1 | FREE ELECTRON LASER | EUROPEAN XFEL BEAMLINE SPB/SFX | 1.3332 | European XFEL | SPB/SFX |
Serial Crystallography
| Sample delivery method |
|---|
| Diffraction ID | Description | Sample Delivery Method |
|---|
| 1 | | injection |
Data Collection
| Overall |
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot |
|---|
| 1 | 2.1 | 21.66 | 99.9 | 0.906 | 5.1 | 1 | | 7448 | | | |
| Highest Resolution Shell |
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) |
|---|
| 1 | 2.1 | 2.155 | 100 | | 0.787 | | | |
Refinement
| Statistics |
|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B |
|---|
| X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | THROUGHOUT | 6FTR | 2.1 | 21.66 | 6681 | 737 | 99.84 | 0.1585 | 0.152 | 0.16 | 0.2163 | 0.22 | RANDOM | 19.575 |
| Temperature Factor Modeling |
|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] |
|---|
| -0.14 | | | -0.14 | | 0.27 |
| RMS Deviations |
|---|
| Key | Refinement Restraint Deviation |
|---|
| r_dihedral_angle_2_deg | 30.879 |
| r_dihedral_angle_4_deg | 23.158 |
| r_dihedral_angle_3_deg | 12.527 |
| r_dihedral_angle_1_deg | 7.207 |
| r_angle_refined_deg | 1.453 |
| r_rigid_bond_restr | 1.395 |
| r_angle_other_deg | 1.383 |
| r_chiral_restr | 0.077 |
| r_bond_refined_d | 0.007 |
| r_gen_planes_refined | 0.005 |
| RMS Deviations |
|---|
| Key | Refinement Restraint Deviation |
|---|
| r_dihedral_angle_2_deg | 30.879 |
| r_dihedral_angle_4_deg | 23.158 |
| r_dihedral_angle_3_deg | 12.527 |
| r_dihedral_angle_1_deg | 7.207 |
| r_angle_refined_deg | 1.453 |
| r_rigid_bond_restr | 1.395 |
| r_angle_other_deg | 1.383 |
| r_chiral_restr | 0.077 |
| r_bond_refined_d | 0.007 |
| r_gen_planes_refined | 0.005 |
| r_bond_other_d | 0.001 |
| r_gen_planes_other | 0.001 |
| Non-Hydrogen Atoms Used in Refinement |
|---|
| Non-Hydrogen Atoms | Number |
|---|
| Protein Atoms | 1000 |
| Nucleic Acid Atoms | |
| Solvent Atoms | 51 |
| Heterogen Atoms | 9 |
Software
| Software |
|---|
| Software Name | Purpose |
|---|
| Aimless | data scaling |
| PHASER | phasing |
| REFMAC | refinement |
| PDB_EXTRACT | data extraction |
| Cheetah | data collection |
| Coot | model building |
| CrystFEL | data reduction |
