Experiment: 6MXF

ELECTRON CRYSTALLOGRAPHY

Initial Refinement Model(s)
Type	Source	Accession Code	Details
experimental model	PDB	1E9W

Symmetry
Space Group	P 43 21 2

Diffraction Experiment
ID #	Crystal ID	Scattering Type	Data Collection Temperature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1	1						2018-10-03

Radiation Source
ID #	Source	Type	Wavelength List	Synchrotron Site	Beamline
1			0.0251

Overall
ID #	Resolution (High)	Resolution (Low)	Percent Possible (Observed)	R Merge I (Observed)	Rrim I (All)	Rpim I (All)	CC (Half)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1	1.9	18.99	78.6	0.236	0.251	0.084	0.985	5.1	8.1		686

Highest Resolution Shell
ID #	Resolution (High)	Resolution (Low)	Percent Possible (All)	Percent Possible (Observed)	R Merge I (Observed)	CC (Half)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
	1.9	2.13	40.3		0.32	0.813	3.4	4.9	93

Statistics
Diffraction ID	Structure Solution Method	Cross Validation method	Starting model	Resolution (High)	Resolution (Low)	Number Reflections (Observed)	Number Reflections (R-Free)	Percent Reflections (Observed)	R-Factor (Observed)	R-Work (Depositor)	R-Free (Depositor)	R-Free Selection Details	Mean Isotropic B
ELECTRON CRYSTALLOGRAPHY	MOLECULAR REPLACEMENT	THROUGHOUT	1e9w	1.91	18.99	620	57	78.18	0.19276	0.19046	0.21798	RANDOM	6.811

Temperature Factor Modeling
Anisotropic B[1][1]	Anisotropic B[1][2]	Anisotropic B[1][3]	Anisotropic B[2][2]	Anisotropic B[2][3]	Anisotropic B[3][3]
0.18			0.18		-0.37

RMS Deviations
Key	Refinement Restraint Deviation
r_dihedral_angle_3_deg	7.901
r_dihedral_angle_1_deg	3.623
r_angle_refined_deg	2.76
r_long_range_B_refined	1.546
r_long_range_B_other	1.539
r_angle_other_deg	1.374
r_mcangle_it	0.893
r_scangle_other	0.892
r_mcangle_other	0.881
r_mcbond_it	0.625

RMS Deviations
Key	Refinement Restraint Deviation
r_dihedral_angle_3_deg	7.901
r_dihedral_angle_1_deg	3.623
r_angle_refined_deg	2.76
r_long_range_B_refined	1.546
r_long_range_B_other	1.539
r_angle_other_deg	1.374
r_mcangle_it	0.893
r_scangle_other	0.892
r_mcangle_other	0.881
r_mcbond_it	0.625
r_mcbond_other	0.62
r_scbond_it	0.609
r_scbond_other	0.604
r_chiral_restr	0.062
r_bond_other_d	0.025
r_bond_refined_d	0.015
r_gen_planes_refined	0.01
r_gen_planes_other	0.003
r_dihedral_angle_2_deg
r_dihedral_angle_4_deg
r_nbd_refined
r_nbd_other
r_nbtor_refined
r_nbtor_other
r_xyhbond_nbd_refined
r_xyhbond_nbd_other
r_metal_ion_refined
r_metal_ion_other
r_symmetry_vdw_refined
r_symmetry_vdw_other
r_symmetry_hbond_refined
r_symmetry_hbond_other
r_symmetry_metal_ion_refined
r_symmetry_metal_ion_other
r_scangle_it
r_rigid_bond_restr
r_sphericity_free
r_sphericity_bonded

Sample
Thiostrepton

Specimen Preparation
Sample Aggregation State	3D ARRAY
Vitrification Instrument
Cryogen Name	NITROGEN
Sample Vitrification Details	Hand-plunged

3D Reconstruction
Reconstruction Method	CRYSTALLOGRAPHY
Number of Particles
Reported Resolution (Å)	1.91
Resolution Method	DIFFRACTION PATTERN/LAYERLINES
Other Details
Refinement Type
Symmetry Type	3D CRYSTAL
Space Group Name
Length a	26.219
Length b	26.219
Length c	26.219
Angle Alpha	90
Angle Beta	90
Angle Gamma	90

Map-Model Fitting and Refinement
Id	1 (1E9W)
Refinement Space	RECIPROCAL
Refinement Protocol	OTHER
Refinement Target
Overall B Value	2.6
Fitting Procedure
Details

Data Acquisition
Detector Type	FEI CETA (4k x 4k)
Electron Dose (electrons/Å**2)	0.09

Imaging Experiment	1
Date of Experiment
Temperature (Kelvin)
Microscope Model	FEI TALOS ARCTICA
Minimum Defocus (nm)
Maximum Defocus (nm)
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging Mode	DIFFRACTION
Specimen Holder Model	FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification
Calibrated Magnification
Source	FIELD EMISSION GUN
Acceleration Voltage (kV)	200
Imaging Details