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CryoEM Structure of INO80core
Refinement RMS Deviations Key Refinement Restraint Deviation f_dihedral_angle_d 7.823 f_angle_d 0.819 f_chiral_restr 0.053 f_plane_restr 0.007 f_bond_d 0.005
Sample INO80core masked reconstruction
Specimen Preparation Sample Aggregation State PARTICLE Vitrification Instrument LEICA EM GP Cryogen Name ETHANE Sample Vitrification Details
3D Reconstruction Reconstruction Method SINGLE PARTICLE Number of Particles 144278 Reported Resolution (Å) 3.754 Resolution Method FSC 0.143 CUT-OFF Other Details Refinement Type Symmetry Type POINT Point Symmetry C1 Space Group Name Length a 1 Length b 1 Length c 1 Angle Alpha 90 Angle Beta 90 Angle Gamma 90
Map-Model Fitting and Refinement Id 1 Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Details
Data Acquisition Detector Type GATAN K2 SUMMIT (4k x 4k) Electron Dose (electrons/Å**2) 59.6
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model FEI TITAN KRIOS Minimum Defocus (nm) Maximum Defocus (nm) 3500 Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode BRIGHT FIELD Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 300 Imaging Details
EM Software Task Software Package Version PARTICLE SELECTION RELION 2.1.1b IMAGE ACQUISITION SerialEM 3.6 CTF CORRECTION CTFFIND 4 MODEL FITTING Coot 0.8.9 INITIAL EULER ASSIGNMENT cryoSPARC FINAL EULER ASSIGNMENT RELION 2.1.1b RECONSTRUCTION RELION 2.1.1b MODEL REFINEMENT PHENIX 1.12
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details PHASE FLIPPING AND AMPLITUDE CORRECTION 251692