5W52

MicroED structure of the segment, DLIIKGISVHI, from the RRM2 of TDP-43, residues 247-257


ELECTRON CRYSTALLOGRAPHY

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1BATCH8.531050 mM CHES, pH 8.5
Crystal Properties
Matthews coefficientSolvent content
1.5118.73

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 24.81α = 80.88
b = 4.73β = 86.37
c = 15.83γ = 89.78
Symmetry
Space GroupP 1

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11 100CMOSTVIPS F416 CMOS CAMERA2017-01-19
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1ELECTRON MICROSCOPETECNAI F20 TEM0.0251

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)Rrim I (All)CC (Half)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
11.415.673.40.2030.2130.9923.349.0191037-321.481
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R Merge I (Observed)Rrim I (All)CC (Half)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
11.41.4862.11.4511.5620.3330.926.712

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodStarting modelResolution (High)Resolution (Low)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
ELECTRON CRYSTALLOGRAPHYMOLECULAR REPLACEMENTTHROUGHOUTidealized 11-residue beta strand1.415.69449272.040.26550.26190.3065RANDOM33.756
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
20.78-1.04-18.05-25.77-3.484.98
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg23.273
r_dihedral_angle_3_deg7.47
r_dihedral_angle_1_deg6.438
r_angle_refined_deg1.211
r_angle_other_deg0.776
r_chiral_restr0.079
r_bond_other_d0.017
r_bond_refined_d0.009
r_gen_planes_refined0.004
r_gen_planes_other
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms84
Nucleic Acid Atoms
Solvent Atoms
Heterogen Atoms

Software

Software
Software NamePurpose
XSCALEdata scaling
PHASERphasing
REFMACrefinement
PDB_EXTRACTdata extraction
XDSdata reduction
Sample
DLIIKGISVHI fibril
Specimen Preparation
Sample Aggregation State3D ARRAY
Vitrification Instrument
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodCRYSTALLOGRAPHY
Number of Particles
Reported Resolution (Å)
Resolution MethodDIFFRACTION PATTERN/LAYERLINES
Other Details
Refinement Type
Symmetry Type3D CRYSTAL
Space Group Name
Length a24.81
Length b4.73
Length c4.73
Angle Alpha89.78
Angle Beta86.37
Angle Gamma89.78
Map-Model Fitting and Refinement
Id1
Refinement Space
Refinement Protocol
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeTVIPS TEMCAM-F416 (4k x 4k)
Electron Dose (electrons/Å**2)3.4
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TECNAI 20
Minimum Defocus (nm)
Maximum Defocus (nm)
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeDIFFRACTION
Specimen Holder Model
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)200
Imaging Details
EM Software
TaskSoftware PackageVersion
IMAGE ACQUISITIONTVIPSF416
MODEL FITTINGCoot
MOLECULAR REPLACEMENTPhaser
CRYSTALLOGRAPHY MERGINGXSCALE
MODEL REFINEMENTREFMAC
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
NONE