3J95
Structure of ADP-bound N-ethylmaleimide sensitive factor determined by single particle cryoelectron microscopy
ELECTRON MICROSCOPY
Refinement
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation |
| f_dihedral_angle_d | 16.294 |
| f_angle_d | 1.976 |
| f_chiral_restr | 0.085 |
| f_bond_d | 0.011 |
| f_plane_restr | 0.008 |
| Sample |
|---|
| ADP-bound N-ethylmaleimide sensitive factor |
| Specimen Preparation | |
|---|---|
| Sample Aggregation State | PARTICLE |
| Vitrification Instrument | FEI VITROBOT MARK I |
| Cryogen Name | ETHANE |
| Sample Vitrification Details | Blot for 3.5 seconds before plunging into liquid ethane (FEI VITROBOT MARK I). |
| 3D Reconstruction | |
|---|---|
| Reconstruction Method | SINGLE PARTICLE |
| Number of Particles | 12830 |
| Reported Resolution (Å) | 7.6 |
| Resolution Method | FSC 0.143 CUT-OFF |
| Other Details | (Single particle--Applied symmetry: C1) |
| Refinement Type | |
| Symmetry Type | POINT |
| Point Symmetry | C1 |
| Map-Model Fitting and Refinement | |||||
|---|---|---|---|---|---|
| Id | 1 (1NSF) | ||||
| Refinement Space | RECIPROCAL | ||||
| Refinement Protocol | FLEXIBLE FIT | ||||
| Refinement Target | R-factor | ||||
| Overall B Value | |||||
| Fitting Procedure | |||||
| Details | REFINEMENT PROTOCOL--flexible DETAILS--D2 domain of NSF was from crystal structure 1NSF. D1 domain of NSF was from related entry EMD-6204. | ||||
| Data Acquisition | |||||||||
|---|---|---|---|---|---|---|---|---|---|
| Detector Type | GATAN K2 (4k x 4k) | ||||||||
| Electron Dose (electrons/Å**2) | 44 | ||||||||
| Imaging Experiment | 1 |
|---|---|
| Date of Experiment | 2014-01-14 |
| Temperature (Kelvin) | |
| Microscope Model | FEI POLARA 300 |
| Minimum Defocus (nm) | -1800 |
| Maximum Defocus (nm) | -2800 |
| Minimum Tilt Angle (degrees) | |
| Maximum Tilt Angle (degrees) | |
| Nominal CS | 2.3 |
| Imaging Mode | BRIGHT FIELD |
| Specimen Holder Model | OTHER |
| Nominal Magnification | 31000 |
| Calibrated Magnification | |
| Source | FIELD EMISSION GUN |
| Acceleration Voltage (kV) | 300 |
| Imaging Details |
| EM Software | ||
|---|---|---|
| Task | Software Package | Version |
| MODEL FITTING | PHENIX | |
| MODEL FITTING | UCSF Chimera | |
| RECONSTRUCTION | RELION | |
| Image Processing | ||||
|---|---|---|---|---|
| CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
| Each particle | ||||
