3J95
Structure of ADP-bound N-ethylmaleimide sensitive factor determined by single particle cryoelectron microscopy
ELECTRON MICROSCOPY
Starting Model(s)
Initial Refinement Model(s) | |||
---|---|---|---|
Type | Source | Accession Code | Details |
experimental model | PDB | 1NSF |
Refinement
RMS Deviations | |
---|---|
Key | Refinement Restraint Deviation |
f_dihedral_angle_d | 16.294 |
f_angle_d | 1.976 |
f_chiral_restr | 0.085 |
f_bond_d | 0.011 |
f_plane_restr | 0.008 |
Sample |
---|
ADP-bound N-ethylmaleimide sensitive factor |
Specimen Preparation | |
---|---|
Sample Aggregation State | PARTICLE |
Vitrification Instrument | FEI VITROBOT MARK I |
Cryogen Name | ETHANE |
Sample Vitrification Details | Blot for 3.5 seconds before plunging into liquid ethane (FEI VITROBOT MARK I). |
3D Reconstruction | |
---|---|
Reconstruction Method | SINGLE PARTICLE |
Number of Particles | 12830 |
Reported Resolution (Å) | 7.6 |
Resolution Method | FSC 0.143 CUT-OFF |
Other Details | (Single particle--Applied symmetry: C1) |
Refinement Type | |
Symmetry Type | POINT |
Point Symmetry | C1 |
Map-Model Fitting and Refinement | |||||
---|---|---|---|---|---|
Id | 1 (1NSF) | ||||
Refinement Space | RECIPROCAL | ||||
Refinement Protocol | FLEXIBLE FIT | ||||
Refinement Target | R-factor | ||||
Overall B Value | |||||
Fitting Procedure | |||||
Details | REFINEMENT PROTOCOL--flexible DETAILS--D2 domain of NSF was from crystal structure 1NSF. D1 domain of NSF was from related entry EMD-6204. |
Data Acquisition | |||||||||
---|---|---|---|---|---|---|---|---|---|
Detector Type | GATAN K2 (4k x 4k) | ||||||||
Electron Dose (electrons/Å**2) | 44 |
Imaging Experiment | 1 |
---|---|
Date of Experiment | 2014-01-14 |
Temperature (Kelvin) | |
Microscope Model | FEI POLARA 300 |
Minimum Defocus (nm) | -1800 |
Maximum Defocus (nm) | -2800 |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | 2.3 |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | OTHER |
Nominal Magnification | 31000 |
Calibrated Magnification | |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 300 |
Imaging Details |
EM Software | ||
---|---|---|
Task | Software Package | Version |
MODEL FITTING | PHENIX | |
MODEL FITTING | UCSF Chimera | |
RECONSTRUCTION | RELION |
Image Processing | ||||
---|---|---|---|---|
CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
Each particle |