ELECTRON MICROSCOPY
| Sample |
|---|
| KIF1A head decorated-microtubule complex |
| Specimen Preparation | |
|---|---|
| Sample Aggregation State | FILAMENT |
| Vitrification Instrument | |
| Cryogen Name | |
| Sample Vitrification Details | Ethan slash |
| 3D Reconstruction | |
|---|---|
| Reconstruction Method | HELICAL |
| Number of Particles | |
| Reported Resolution (Å) | 10 |
| Resolution Method | |
| Other Details | |
| Refinement Type | |
| Symmetry Type | HELICAL |
| Map-Model Fitting and Refinement | |||||
|---|---|---|---|---|---|
| Id | 1 (1JFF, 1VFV) | ||||
| Refinement Space | REAL | ||||
| Refinement Protocol | RIGID BODY FIT | ||||
| Refinement Target | Best cross-correlation | ||||
| Overall B Value | |||||
| Fitting Procedure | |||||
| Details | REFINEMENT PROTOCOL--rigid body REFINEMENT | ||||
| Data Acquisition | |||||||||
|---|---|---|---|---|---|---|---|---|---|
| Detector Type | KODAK SO-163 FILM | ||||||||
| Electron Dose (electrons/Å**2) | 10 | ||||||||
| Imaging Experiment | 1 |
|---|---|
| Date of Experiment | 1999-01-01 |
| Temperature (Kelvin) | 100 |
| Microscope Model | JEOL 2010F |
| Minimum Defocus (nm) | 11000 |
| Maximum Defocus (nm) | 33000 |
| Minimum Tilt Angle (degrees) | |
| Maximum Tilt Angle (degrees) | |
| Nominal CS | 3.3 |
| Imaging Mode | BRIGHT FIELD |
| Specimen Holder Model | |
| Nominal Magnification | 40000 |
| Calibrated Magnification | 40000 |
| Source | FIELD EMISSION GUN |
| Acceleration Voltage (kV) | 200 |
| Imaging Details |
| EM Software | ||
|---|---|---|
| Task | Software Package | Version |
| CTF CORRECTION | CTFFIND | 3 |
| MODEL FITTING | SITUS COLORES | |
| RECONSTRUCTION | Ruby-Helix | |
| Image Processing | ||||
|---|---|---|---|---|
| CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
| each filament | ||||
