7QGQ

Extended H/L (SLPH/SLPL) complex from C. difficile (CD630 strain) fit into R20291 S-layer negative stain map


ELECTRON CRYSTALLOGRAPHY

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 321α = 90
b = 261β = 90
c = 345.312γ = 90
Symmetry
Space GroupP 1

Refinement

Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
Sample
Electron crystallographic reconstruction of R20291 S-layer, extended to cover 12 molecules of SlpA for flexible fitting of X-ray structure to map
Specimen Preparation
Sample Aggregation State2D ARRAY
Staining TypeNEGATIVE
Staining MaterialUranyl Formate
Staining DetailsNegatively stained EM samples were prepared by depositing sample on continuous carbon layer and staining with 2 % Uranyl Formate with blotting
3D Reconstruction
Reconstruction MethodCRYSTALLOGRAPHY
Number of Particles
Reported Resolution (Å)
Resolution MethodDIFFRACTION PATTERN/LAYERLINES
Other Details
Refinement Type
Symmetry Type3D CRYSTAL
Space Group Name
Length a80
Length b80
Length c80
Angle Alpha100
Angle Beta90
Angle Gamma100
Map-Model Fitting and Refinement
Id1
Refinement SpaceREAL
Refinement ProtocolFLEXIBLE FIT
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN ULTRASCAN 4000 (4k x 4k)
Electron Dose (electrons/Å**2)0.1
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI/PHILIPS CM200FEG
Minimum Defocus (nm)800
Maximum Defocus (nm)2200
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)200
Imaging Details
EM Software
TaskSoftware PackageVersion
CTF CORRECTIONCTFFIND3
MODEL FITTINGISOLDE1.1.0
LATTICE DISTORTION CORRECTIONMRC IMAGE PROCESSING PACKAGE
SYMMETRY DETERMINATIONMRC IMAGE PROCESSING PACKAGE
CRYSTALLOGRAPHY MERGINGMRC IMAGE PROCESSING PACKAGE
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION