ELECTRON MICROSCOPY
Refinement
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation |
| f_dihedral_angle_d | 4.137 |
| f_angle_d | 0.613 |
| f_chiral_restr | 0.041 |
| f_plane_restr | 0.005 |
| f_bond_d | 0.003 |
| Sample |
|---|
| Structure of KICSTOR complex |
| Specimen Preparation | |
|---|---|
| Sample Aggregation State | PARTICLE |
| Vitrification Instrument | |
| Cryogen Name | ETHANE |
| Sample Vitrification Details | |
| 3D Reconstruction | |
|---|---|
| Reconstruction Method | SINGLE PARTICLE |
| Number of Particles | 228198 |
| Reported Resolution (Å) | 3.19 |
| Resolution Method | FSC 0.143 CUT-OFF |
| Other Details | |
| Refinement Type | |
| Symmetry Type | POINT |
| Map-Model Fitting and Refinement | |||||
|---|---|---|---|---|---|
| Id | 1 | ||||
| Refinement Space | |||||
| Refinement Protocol | |||||
| Refinement Target | |||||
| Overall B Value | |||||
| Fitting Procedure | |||||
| Details | |||||
| Data Acquisition | |||||||||
|---|---|---|---|---|---|---|---|---|---|
| Detector Type | GATAN K3 (6k x 4k) | GATAN K3 (6k x 4k) | GATAN K3 (6k x 4k) | GATAN K3 (6k x 4k) | |||||
| Electron Dose (electrons/Å**2) | 54.74 | 53.88 | 52.4 | 59.61 | |||||
| Imaging Experiment | 1 | 2 | 3 | 4 |
|---|---|---|---|---|
| Date of Experiment | ||||
| Temperature (Kelvin) | ||||
| Microscope Model | TFS KRIOS | TFS KRIOS | TFS KRIOS | TFS KRIOS |
| Minimum Defocus (nm) | 1200 | 1200 | 1200 | 1200 |
| Maximum Defocus (nm) | 1800 | 1800 | 1800 | 1800 |
| Minimum Tilt Angle (degrees) | ||||
| Maximum Tilt Angle (degrees) | ||||
| Nominal CS | ||||
| Imaging Mode | BRIGHT FIELD | BRIGHT FIELD | BRIGHT FIELD | BRIGHT FIELD |
| Specimen Holder Model | ||||
| Nominal Magnification | ||||
| Calibrated Magnification | ||||
| Source | FIELD EMISSION GUN | FIELD EMISSION GUN | FIELD EMISSION GUN | FIELD EMISSION GUN |
| Acceleration Voltage (kV) | 300 | 300 | 300 | 300 |
| Imaging Details |
| EM Software | ||
|---|---|---|
| Task | Software Package | Version |
| MODEL REFINEMENT | PHENIX | |
| Image Processing | ||||
|---|---|---|---|---|
| CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
| NONE | ||||
| NONE | ||||
| NONE | ||||
| NONE | ||||
