Crystal structure of Chi430 mutant E176A in the substrate complex
Serial Crystallography (SX)
Starting Model(s)
| Initial Refinement Model(s) |
|---|
| Type | Source | Accession Code | Details |
|---|
|
in silico model | AlphaFold | | |
Crystallization
| Crystalization Experiments |
|---|
| ID | Method | pH | Temperature | Details |
|---|
| 1 | VAPOR DIFFUSION, SITTING DROP | 4.5 | 290 | 0.1 M BIS-TRIS pH 5.5, 2.0 M Ammonium sulfate |
| Crystal Properties |
|---|
| Matthews coefficient | Solvent content |
|---|
| 2.48 | 50.42 |
Crystal Data
| Unit Cell |
|---|
| Length ( Å ) | Angle ( ˚ ) |
|---|
| a = 121.676 | α = 90 |
| b = 49.858 | β = 125.62 |
| c = 92.602 | γ = 90 |
| Symmetry |
|---|
| Space Group | C 1 2 1 |
|---|
Diffraction
| Diffraction Experiment |
|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|
| 1 | 1 | x-ray | 100 | PIXEL | DECTRIS EIGER X 16M | | 2025-01-03 | M | SINGLE WAVELENGTH |
| Radiation Source |
|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|
| 1 | SYNCHROTRON | SSRF BEAMLINE BL10U2 | 0.97918 | SSRF | BL10U2 |
Serial Crystallography
| Sample delivery method |
|---|
| Diffraction ID | Description | Sample Delivery Method |
|---|
| 1 | | fixed target |
Data Collection
| Overall |
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot |
|---|
| 1 | 1.35 | 60.58 | 99.8 | 0.974 | 7.4 | 6 | | 98938 | | | 6.58 |
| Highest Resolution Shell |
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) |
|---|
| 1 | 1.35 | 1.39 | | | 0.189 | 2.5 | 4.4 | |
Refinement
| Statistics |
|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Free (Depositor) | R-Free Selection Details | Mean Isotropic B |
|---|
| X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | THROUGHOUT | 1.35 | 49.51 | 94012 | 4902 | 99.77 | 0.18514 | 0.1842 | 0.20328 | RANDOM | 10.787 |
| Temperature Factor Modeling |
|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] |
|---|
| -0.06 | | 0.24 | -0.41 | | 0.06 |
| RMS Deviations |
|---|
| Key | Refinement Restraint Deviation |
|---|
| r_dihedral_angle_3_deg | 12.533 |
| r_dihedral_angle_1_deg | 6.28 |
| r_long_range_B_refined | 4.679 |
| r_long_range_B_other | 4.664 |
| r_dihedral_angle_2_deg | 4.058 |
| r_scangle_other | 3.814 |
| r_scbond_other | 2.438 |
| r_scbond_it | 2.436 |
| r_mcangle_it | 1.97 |
| r_mcangle_other | 1.969 |
| RMS Deviations |
|---|
| Key | Refinement Restraint Deviation |
|---|
| r_dihedral_angle_3_deg | 12.533 |
| r_dihedral_angle_1_deg | 6.28 |
| r_long_range_B_refined | 4.679 |
| r_long_range_B_other | 4.664 |
| r_dihedral_angle_2_deg | 4.058 |
| r_scangle_other | 3.814 |
| r_scbond_other | 2.438 |
| r_scbond_it | 2.436 |
| r_mcangle_it | 1.97 |
| r_mcangle_other | 1.969 |
| r_angle_refined_deg | 1.959 |
| r_mcbond_it | 1.269 |
| r_mcbond_other | 1.269 |
| r_angle_other_deg | 0.69 |
| r_chiral_restr | 0.104 |
| r_bond_refined_d | 0.012 |
| r_gen_planes_refined | 0.012 |
| r_bond_other_d | 0.001 |
| r_gen_planes_other | 0.001 |
| r_dihedral_angle_4_deg | |
| r_nbd_refined | |
| r_nbd_other | |
| r_nbtor_refined | |
| r_nbtor_other | |
| r_xyhbond_nbd_refined | |
| r_xyhbond_nbd_other | |
| r_metal_ion_refined | |
| r_metal_ion_other | |
| r_symmetry_vdw_refined | |
| r_symmetry_vdw_other | |
| r_symmetry_hbond_refined | |
| r_symmetry_hbond_other | |
| r_symmetry_metal_ion_refined | |
| r_symmetry_metal_ion_other | |
| r_scangle_it | |
| r_rigid_bond_restr | |
| r_sphericity_free | |
| r_sphericity_bonded | |
| Non-Hydrogen Atoms Used in Refinement |
|---|
| Non-Hydrogen Atoms | Number |
|---|
| Protein Atoms | 3295 |
| Nucleic Acid Atoms | |
| Solvent Atoms | 210 |
| Heterogen Atoms | |
Software
| Software |
|---|
| Software Name | Purpose |
|---|
| REFMAC | refinement |
| DIALS | data reduction |
| Aimless | data scaling |
| PHENIX | phasing |