9G93 | pdb_00009g93

CryoET structure of the in vitro grown Bacillus anthracis Sap S-layer


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d17.622
f_angle_d1.0196
f_chiral_restr0.0633
f_bond_d0.0087
f_plane_restr0.0054
Sample
in vitro S-layer of the Sap assembly domain
Specimen Preparation
Sample Aggregation State2D ARRAY
Vitrification Instrument
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodSUBTOMOGRAM AVERAGING
Number of Particles10126
Reported Resolution (Å)7.2
Resolution MethodFSC 0.143 CUT-OFF
Other DetailsFinal half map reconstruction was done in Dynamo and resolution was estimated using RELION 3.1 postprocessing
Refinement Type
Symmetry TypePOINT
Point SymmetryC1
Map-Model Fitting and Refinement
Id1
Refinement Space
Refinement Protocol
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å**2)3.8
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)2000
Maximum Defocus (nm)3500
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification81000
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
VOLUME SELECTIONDynamo1.1.401
IMAGE ACQUISITIONSerialEM
CTF CORRECTIONGctf1.06
CTF CORRECTIONNOVACTF
FINAL EULER ASSIGNMENTDynamo1.1.478
RECONSTRUCTIONDynamo1.1.478
RECONSTRUCTIONRELION3.1
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING ONLY