| Specimen Preparation |
|---|
| Sample Aggregation State | PARTICLE |
|---|
| Vitrification Instrument | |
|---|
| Cryogen Name | OTHER |
|---|
| Sample Vitrification Details | |
|---|
| 3D Reconstruction |
|---|
| Reconstruction Method | SINGLE PARTICLE |
|---|
| Number of Particles | 39008 |
|---|
| Reported Resolution (Å) | 8.57 |
|---|
| Resolution Method | FSC 0.143 CUT-OFF |
|---|
| Other Details | |
|---|
| Refinement Type | |
|---|
| Symmetry Type | POINT |
|---|
| Map-Model Fitting and Refinement |
|---|
| Id | 1 |
|---|
| Refinement Space | |
|---|
| Refinement Protocol | |
|---|
| Refinement Target | |
|---|
| Overall B Value | |
|---|
| Fitting Procedure | |
|---|
| Details | |
|---|
| Data Acquisition |
|---|
| Detector Type | FEI FALCON IV (4k x 4k) |
|---|
| Electron Dose (electrons/Å**2) | 50 |
|---|
| Imaging Experiment | 1 |
|---|
| Date of Experiment | |
|---|
| Temperature (Kelvin) | |
|---|
| Microscope Model | FEI TITAN KRIOS |
|---|
| Minimum Defocus (nm) | 1500 |
|---|
| Maximum Defocus (nm) | 3000 |
|---|
| Minimum Tilt Angle (degrees) | |
|---|
| Maximum Tilt Angle (degrees) | |
|---|
| Nominal CS | |
|---|
| Imaging Mode | OTHER |
|---|
| Specimen Holder Model | |
|---|
| Nominal Magnification | |
|---|
| Calibrated Magnification | |
|---|
| Source | FIELD EMISSION GUN |
|---|
| Acceleration Voltage (kV) | 300 |
|---|
| Imaging Details | |
|---|
| Image Processing |
|---|
| CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details |
|---|
| NONE | | | |
