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Stat6 bound to degrader AK-1690
Starting Model(s) Initial Refinement Model(s) Type Source Accession Code Details experimental model PDB 4Y5U
Crystallization Crystalization Experiments ID Method pH Temperature Details 1 VAPOR DIFFUSION, SITTING DROP 290 0.1 M succinic acid pH 7.0, 15% (w/v) PEG 3350, 6 mM strontium chloride hexahydrate, and 10% mixed additive (0.33% w/v 1,5-Naphthalenedisulfonic acid disodium salt, 0.33% w/v Naphthalene-1,3,6-trisulfonic acid trisodium salt hydrate, 0.33% w/v PIPES, and 0.02 M HEPES sodium pH 6.8)
Crystal Properties Matthews coefficient Solvent content 2.68 54.11
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 103.505 α = 90 b = 103.505 β = 90 c = 53.059 γ = 120
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1 x-ray 100 PIXEL DECTRIS EIGER X 9M 2022-03-22 M SINGLE WAVELENGTH
Radiation Source ID # Source Type Wavelength List Synchrotron Site Beamline 1 SYNCHROTRON APS BEAMLINE 21-ID-D 1.127 APS 21-ID-D
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) Rrim I (All) Rpim I (All) CC (Half) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1 3.22 50 99.6 0.076 0.08 0.024 0.995 7.5 10.5 10231
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) R Merge I (Observed) Rrim I (All) Rpim I (All) CC (Half) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 1 3.22 3.28 100 1.028 1.087 0.353 0.784 9.2
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Resolution (High) Resolution (Low) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Work (DCC) R-Free (Depositor) R-Free (DCC) R-Free Selection Details Mean Isotropic B X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.304 33.88 9026 492 94.7 0.2092 0.2046 0.2055 0.2887 0.2981 RANDOM 51.37
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3] -0.2233 -0.2233 0.4467
RMS Deviations Key Refinement Restraint Deviation t_other_torsion 19.9 t_omega_torsion 2.41 t_angle_deg 0.9 t_bond_d 0.006 t_dihedral_angle_d t_incorr_chiral_ct t_pseud_angle t_trig_c_planes t_gen_planes t_it
RMS Deviations Key Refinement Restraint Deviation t_other_torsion 19.9 t_omega_torsion 2.41 t_angle_deg 0.9 t_bond_d 0.006 t_dihedral_angle_d t_incorr_chiral_ct t_pseud_angle t_trig_c_planes t_gen_planes t_it t_nbd t_improper_torsion t_chiral_improper_torsion t_sum_occupancies t_utility_distance t_utility_angle t_utility_torsion t_ideal_dist_contact
Non-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 3227 Nucleic Acid Atoms Solvent Atoms 117 Heterogen Atoms 71
Software Software Software Name Purpose BUSTER refinement HKL-2000 data reduction HKL-2000 data scaling PHASER phasing