9BAX | pdb_00009bax

PI4KA complex bound to C-terminus of EFR3A


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d12.482
f_angle_d0.49
f_chiral_restr0.035
f_plane_restr0.003
f_bond_d0.002
Sample
Dimer of heterotetramers of PI4KA,TTC7B,FAM126A, and EFR3A c-terminus
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification DetailsBlot force -5, blot time 1.5 s
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles135126
Reported Resolution (Å)3.65
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Point SymmetryC2
Map-Model Fitting and Refinement
Id1
Refinement Space
Refinement Protocol
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeFEI FALCON IV (4k x 4k)
Electron Dose (electrons/Å**2)50
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelTFS KRIOS
Minimum Defocus (nm)500
Maximum Defocus (nm)2000
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification165000
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONcryoSPARCv4.2.1.
IMAGE ACQUISITIONSerialEM
CTF CORRECTIONcryoSPARCv4.2.1.
MODEL REFINEMENTPHENIX
INITIAL EULER ASSIGNMENTcryoSPARCv4.2.1
FINAL EULER ASSIGNMENTcryoSPARCv4.2.1
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION1216317Particles were picked using the cryoSPARC template picker