8UNH

Cryo-EM structure of T4 Bacteriophage Clamp Loader with Sliding Clamp


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d5.375
f_angle_d0.444
f_chiral_restr0.039
f_bond_d0.003
f_plane_restr0.002
Sample
T4 Bacteriophage Clamp Loader with Sliding Clamp
Sample Components
T4 Bacteriophage Sliding Clamp (gp45)
T4 Bacteriophage Clamp Loader (gp44 + gp62)
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles455041
Reported Resolution (Å)3.21
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Map-Model Fitting and Refinement
Id1
Refinement SpaceREAL
Refinement ProtocolOTHER
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K3 (6k x 4k)
Electron Dose (electrons/Å**2)50
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)800
Maximum Defocus (nm)2200
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONcryoSPARC3
IMAGE ACQUISITIONSerialEM
CTF CORRECTIONcryoSPARC3
MODEL FITTINGUCSF Chimera
INITIAL EULER ASSIGNMENTcryoSPARC3
FINAL EULER ASSIGNMENTcryoSPARC3
CLASSIFICATIONcryoSPARC3
RECONSTRUCTIONcryoSPARC3
MODEL REFINEMENTPHENIX
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION17937844