8S2W

SSX structure of Arabidopsis thaliana Pdx1.3 grown in seeded batch conditions


X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1BATCH MODE7294600 mM Sodium citrate and 100 mM HEPES pH 7
Crystal Properties
Matthews coefficientSolvent content
2.8657.05

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 177.9α = 90
b = 177.9β = 90
c = 117.3γ = 120
Symmetry
Space GroupH 3

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray293PIXELPSI JUNGFRAU 4M2023-01-26MSINGLE WAVELENGTH
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONESRF BEAMLINE ID291.07ESRFID29

Serial Crystallography

Sample delivery method
Diffraction IDDescriptionSample Delivery Method
1SOS Chipfixed target
Data Reduction
Diffraction IDFrames IndexedCrystal HitsTotal Frames
11932520268245400

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)CC (Half)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
12.593.331000.964.447.44787849.36
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)CC (Half)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
12.52.541000.170.545.18

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodResolution (High)Resolution (Low)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (All)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONMOLECULAR REPLACEMENTTHROUGHOUT2.564.47247873231699.9940.1690.16760.1934RANDOM59.434
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
-0.005-0.002-0.0050.016
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_3_deg15.18
r_dihedral_angle_6_deg14.129
r_lrange_other11.013
r_lrange_it11.006
r_scangle_it9.179
r_scangle_other9.099
r_dihedral_angle_2_deg7.892
r_mcangle_it6.57
r_mcangle_other6.57
r_dihedral_angle_1_deg6.304
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_3_deg15.18
r_dihedral_angle_6_deg14.129
r_lrange_other11.013
r_lrange_it11.006
r_scangle_it9.179
r_scangle_other9.099
r_dihedral_angle_2_deg7.892
r_mcangle_it6.57
r_mcangle_other6.57
r_dihedral_angle_1_deg6.304
r_scbond_it5.847
r_scbond_other5.714
r_mcbond_it4.34
r_mcbond_other4.339
r_angle_refined_deg1.407
r_angle_other_deg0.458
r_nbd_refined0.213
r_symmetry_nbd_other0.199
r_nbtor_refined0.173
r_symmetry_nbd_refined0.157
r_nbd_other0.152
r_symmetry_xyhbond_nbd_refined0.141
r_xyhbond_nbd_refined0.135
r_symmetry_nbtor_other0.082
r_ncsr_local_group_50.07
r_ncsr_local_group_60.07
r_ncsr_local_group_30.064
r_chiral_restr0.062
r_ncsr_local_group_10.062
r_ncsr_local_group_20.061
r_ncsr_local_group_40.059
r_bond_refined_d0.005
r_gen_planes_refined0.004
r_bond_other_d0.001
r_gen_planes_other0.001
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms8056
Nucleic Acid Atoms
Solvent Atoms181
Heterogen Atoms20

Software

Software
Software NamePurpose
REFMACrefinement
CrystFELdata reduction
CrystFELdata scaling
MOLREPphasing