8RFH

CryoEM structure of the plant helper NLR NRC2 in its resting state


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d6.72
f_angle_d0.758
f_chiral_restr0.044
f_plane_restr0.004
f_bond_d0.002
Sample
NRC2 heler NLR dimer with ADP
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification DetailsThe C-flat grids were coated with grphene oxide, in house and the sample was applied two times inside the vitrobot chamber
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles229347
Reported Resolution (Å)3.9
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Point SymmetryC2
Map-Model Fitting and Refinement
Id1
Refinement SpaceREAL
Refinement ProtocolFLEXIBLE FIT
Refinement TargetCC
Overall B Value100
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K3 (6k x 4k)
Electron Dose (electrons/Å**2)50
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelTFS KRIOS
Minimum Defocus (nm)1500
Maximum Defocus (nm)2700
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification105000
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
IMAGE ACQUISITIONEPU
CTF CORRECTIONRELION
MODEL FITTINGCoot0.9.6
MODEL FITTINGUCSF ChimeraX1.3
INITIAL EULER ASSIGNMENTRELION
CLASSIFICATIONRELION4
RECONSTRUCTIONRELION
MODEL REFINEMENTPHENIX1.20.1_4487:
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING ONLYTbhe autopick program picked so many particles including non-protein stuffs