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The cryo-EM map of TIC-TIEA complex
Refinement RMS Deviations Key Refinement Restraint Deviation f_dihedral_angle_d 17.492 f_angle_d 0.624 f_chiral_restr 0.041 f_plane_restr 0.005 f_bond_d 0.004
Sample The cryo-EM map of TIC-TIEA complex
Specimen Preparation Sample Aggregation State PARTICLE Vitrification Instrument Cryogen Name ETHANE Sample Vitrification Details
3D Reconstruction Reconstruction Method SINGLE PARTICLE Number of Particles 83306 Reported Resolution (Å) 3.5 Resolution Method FSC 0.143 CUT-OFF Other Details Refinement Type Symmetry Type POINT Point Symmetry C1
Map-Model Fitting and Refinement Id 1 Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Details
Data Acquisition Detector Type GATAN K3 (6k x 4k) Electron Dose (electrons/Å**2) 60
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model TFS KRIOS Minimum Defocus (nm) 1200 Maximum Defocus (nm) 3000 Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode BRIGHT FIELD Specimen Holder Model Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 300 Imaging Details
EM Software Task Software Package Version IMAGE ACQUISITION EPU MODEL REFINEMENT PHENIX CLASSIFICATION cryoSPARC 2.2
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details NONE 3465772