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Electron crystallographic structure of TIA-1 prion-like domain, A381T mutant
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 30.68 α = 90 b = 9.63 β = 116.15 c = 26.25 γ = 90
Symmetry Space Group C 1 2 1
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Resolution (High) Resolution (Low) Cut-off Sigma (F) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Work (DCC) R-Free (Depositor) R-Free (DCC) Mean Isotropic B ELECTRON CRYSTALLOGRAPHY THROUGHOUT 0.95 15.147 1.35 3537 356 77.57 0.2558 0.2491 0.2488 0.3073 0.3053 6.7458
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3]
RMS Deviations Key Refinement Restraint Deviation f_dihedral_angle_d 34.424 f_angle_d 3.442 f_chiral_restr 0.172 f_bond_d 0.059 f_plane_restr 0.052
Non-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 83 Nucleic Acid Atoms Solvent Atoms 4 Heterogen Atoms
Software Software Software Name Purpose PHENIX refinement PDB_EXTRACT data extraction
Sample Region 2 peptides (G377-A386) of TIA-1 prion-like domain, A381T
Specimen Preparation Sample Aggregation State FILAMENT
3D Reconstruction Reconstruction Method CRYSTALLOGRAPHY Number of Particles Reported Resolution (Å) Resolution Method DIFFRACTION PATTERN/LAYERLINES Other Details Refinement Type Symmetry Type 3D CRYSTAL Space Group Name Length a 30.68 Length b 9.63 Length c 9.63 Angle Alpha 90 Angle Beta 116.15 Angle Gamma 90
Map-Model Fitting and Refinement Id 1 Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Details
Data Acquisition Detector Type DIRECT ELECTRON DE-64 (8k x 8k) Electron Dose (electrons/Å**2) 0.02
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model JEOL CRYO ARM 300 Minimum Defocus (nm) Maximum Defocus (nm) Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode DIFFRACTION Specimen Holder Model Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 300 Imaging Details
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details NONE