7SW3

MicroED structure of proteinase K from a 95 nm thick lamella measured at 200 kV


ELECTRON CRYSTALLOGRAPHY

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 67.95α = 90
b = 67.95β = 90
c = 102.31γ = 90
Symmetry
Space GroupP 43 21 2

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11 2020-11-14

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)Rrim I (All)Rpim I (All)CC (Half)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
12.352086.60.3490.3860.1590.9683.645.54996631.07
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)Rrim I (All)CC (Half)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
2.352.4388.71.720.329

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodStarting modelResolution (High)Resolution (Low)Cut-off Sigma (F)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeMean Isotropic B
ELECTRON CRYSTALLOGRAPHYMOLECULAR REPLACEMENTFREE R-VALUE6CL72.3533.981.35912644886.850.20220.20010.239927.5
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d5.3587
f_angle_d0.6745
f_chiral_restr0.0427
f_bond_d0.0036
f_plane_restr0.0035

Software

Software
Software NamePurpose
PHENIXrefinement
XDSdata reduction
XSCALEdata scaling
PHASERphasing
Sample
Proteinase K
Specimen Preparation
Sample Aggregation State3D ARRAY
Vitrification InstrumentLEICA PLUNGER
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodCRYSTALLOGRAPHY
Number of Particles
Reported Resolution (Å)
Resolution MethodDIFFRACTION PATTERN/LAYERLINES
Other Details
Refinement Type
Symmetry Type3D CRYSTAL
Space Group Name
Length a67.95
Length b67.95
Length c67.95
Angle Alpha90
Angle Beta90
Angle Gamma90
Map-Model Fitting and Refinement
Id1 (6CL7)
Refinement SpaceRECIPROCAL
Refinement ProtocolRIGID BODY FIT
Refinement TargetMaximum liklihood
Overall B Value29
Fitting Procedure
Details
Data Acquisition
Detector TypeFEI CETA (4k x 4k)
Electron Dose (electrons/Å**2)0.01
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TALOS ARCTICA
Minimum Defocus (nm)
Maximum Defocus (nm)
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeDIFFRACTION
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)200
Imaging Details
EM Software
TaskSoftware PackageVersion
MODEL FITTINGCoot
CRYSTALLOGRAPHY MERGINGAIMLESS
RECONSTRUCTIONPHENIX
MODEL REFINEMENTPHENIX
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
NONE