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IDO1 IN COMPLEX WITH COMPOUND 14
Crystallization Crystalization Experiments ID Method pH Temperature Details 1 VAPOR DIFFUSION 293 0.1 MM TRIS PH 8.0, 20% (W/V) PEG6000, 0.2 M NACL
Crystal Properties Matthews coefficient Solvent content 2.84 56.75
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 84.95 α = 90 b = 91.339 β = 90 c = 129.223 γ = 90
Symmetry Space Group P 21 21 21
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1 x-ray 100 PIXEL DECTRIS PILATUS 6M 2017-09-14 M SINGLE WAVELENGTH
Radiation Source ID # Source Type Wavelength List Synchrotron Site Beamline 1 SYNCHROTRON SLS BEAMLINE X10SA 0.9999 SLS X10SA
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) R Sym I (Observed) Rrim I (All) CC (Half) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1 2.18 74.59 94.7 0.029 0.035 0.999 22.24 3.3 50323 59.436
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Rrim I (All) CC (Half) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 1 2.18 2.43 97.5 0.433 0.516 0.999 3.29 3.2
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Resolution (High) Resolution (Low) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Work (DCC) R-Free (Depositor) R-Free (DCC) R-Free Selection Details Mean Isotropic B X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.18 74.59 48900 1423 94.65 0.1873 0.1865 0.1928 0.2169 0.1901 RANDOM 61.531
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3] -1.49 1.66 -0.17
RMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 38.468 r_dihedral_angle_3_deg 12.546 r_dihedral_angle_4_deg 10.749 r_dihedral_angle_1_deg 5.221 r_angle_refined_deg 1.3 r_angle_other_deg 0.937 r_chiral_restr 0.075 r_bond_refined_d 0.009 r_gen_planes_refined 0.005 r_bond_other_d 0.004
Show All KeysRMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 38.468 r_dihedral_angle_3_deg 12.546 r_dihedral_angle_4_deg 10.749 r_dihedral_angle_1_deg 5.221 r_angle_refined_deg 1.3 r_angle_other_deg 0.937 r_chiral_restr 0.075 r_bond_refined_d 0.009 r_gen_planes_refined 0.005 r_bond_other_d 0.004 r_gen_planes_other 0.001
Hide All KeysNon-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 5942 Nucleic Acid Atoms Solvent Atoms 201 Heterogen Atoms 64
Software Software Software Name Purpose XSCALE data scaling REFMAC refinement PDB_EXTRACT data extraction PHASER phasing