7OOB
Pol II-CSB-CSA-DDB1-UVSSA-ADPBeF3 (Structure2)
ELECTRON MICROSCOPY
Refinement
RMS Deviations | |
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Key | Refinement Restraint Deviation |
f_dihedral_angle_d | 16.87 |
f_angle_d | 0.757 |
f_chiral_restr | 0.048 |
f_bond_d | 0.005 |
f_plane_restr | 0.005 |
Sample |
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Complex between the transcribing RNA polymerase II and TCR factors in the presence of ADP-BeF3. |
Sample Components |
DNA-directed RNA polymerase with RNA_pol_L_2 and RNA polymerase |
DNA excision repair protein ERCC-6 and ERCC-8, DNA damage-binding protein 1 |
NTS, RNA, TS |
Specimen Preparation | |
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Sample Aggregation State | PARTICLE |
Vitrification Instrument | FEI VITROBOT MARK IV |
Cryogen Name | ETHANE |
Sample Vitrification Details |
3D Reconstruction | |
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Reconstruction Method | SINGLE PARTICLE |
Number of Particles | 100000 |
Reported Resolution (Å) | 2.7 |
Resolution Method | FSC 0.143 CUT-OFF |
Other Details | Different final number of particles was used for different focused refined maps. |
Refinement Type | |
Symmetry Type | POINT |
Map-Model Fitting and Refinement | |||||
---|---|---|---|---|---|
Id | 1 | ||||
Refinement Space | |||||
Refinement Protocol | |||||
Refinement Target | |||||
Overall B Value | |||||
Fitting Procedure | |||||
Details |
Data Acquisition | |||||||||
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Detector Type | GATAN K3 (6k x 4k) | ||||||||
Electron Dose (electrons/Å**2) | 41.2 |
Imaging Experiment | 1 |
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Date of Experiment | |
Temperature (Kelvin) | |
Microscope Model | FEI TITAN KRIOS |
Minimum Defocus (nm) | |
Maximum Defocus (nm) | |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | |
Nominal Magnification | |
Calibrated Magnification | |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 300 |
Imaging Details |
EM Software | ||
---|---|---|
Task | Software Package | Version |
CTF CORRECTION | Warp | |
FINAL EULER ASSIGNMENT | RELION | |
RECONSTRUCTION | RELION |
Image Processing | ||||
---|---|---|---|---|
CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
PHASE FLIPPING AND AMPLITUDE CORRECTION | 1855061 |