6I5T

Cryo-EM informed directed evolution of Nitrilase 4 leads to a change in quaternary structure.


ELECTRON MICROSCOPY
Sample
Active helical nitrilase complex
Specimen Preparation
Sample Aggregation StateFILAMENT
Vitrification InstrumentFEI VITROBOT MARK I
Cryogen NameETHANE
Sample Vitrification DetailsThe sample (2.5 ul) was applied to the grid and incubated for 30 seconds at 50% humidity before blotting and plunging.
3D Reconstruction
Reconstruction MethodHELICAL
Number of Particles46493
Reported Resolution (Å)3.9
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypeHELICAL
Axial SymmetryC1
Axial Rise17.31
Angular Rotation72.77
Map-Model Fitting and Refinement
Id1
Refinement SpaceREAL
Refinement ProtocolAB INITIO MODEL
Refinement TargetCross-correlation coefficient
Overall B Value
Fitting Procedure
DetailsAb initio fitting was performed using Buccaneer, cleaned up with Coot and Phenix Real-Space Refine.
Data Acquisition
Detector TypeGATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å**2)45.5
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)750
Maximum Defocus (nm)2000
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
IMAGE ACQUISITIONEPU1.9.1
CTF CORRECTIONGctf1.06
MODEL REFINEMENTPHENIX1.14
INITIAL EULER ASSIGNMENTRELION2.0
FINAL EULER ASSIGNMENTRELION2.0
CLASSIFICATIONRELION2.0
RECONSTRUCTIONRELION2.0
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION1331063D class with a 72.8 degree average helical twist