6BBJ

Xenopus Tropicalis TRPV4


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d10.422
f_angle_d0.686
f_chiral_restr0.044
f_plane_restr0.005
f_bond_d0.003
Sample
TRPV4
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification Details2 second blot time
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles72684
Reported Resolution (Å)3.8
Resolution MethodFSC 0.143 CUT-OFF
Other DetailsRefined using Frealign with reference map low-pass filtered to 6 Angstroms
Refinement Type
Symmetry TypePOINT
Point SymmetryC4
Map-Model Fitting and Refinement
Id1
Refinement SpaceREAL
Refinement ProtocolAB INITIO MODEL
Refinement TargetFSC
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å**2)27
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)800
Maximum Defocus (nm)2500
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification22500
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONRELION2.1
IMAGE ACQUISITIONSerialEM
CTF CORRECTIONCTFFIND4.1.8
MODEL FITTINGUCSF Chimera
MODEL REFINEMENTPHENIX1.12-2829
MODEL REFINEMENTREFMAC5.8.0158
CLASSIFICATIONRELION2.1
RECONSTRUCTIONFREALIGN9.11
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION85253