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Crystal Structure Analysis of the BRD4
Crystallization Crystalization Experiments ID Method pH Temperature Details 1 VAPOR DIFFUSION, SITTING DROP 8 277 20% PEG3350, 0.2M NaNO3, 0.1M HEPES, 10% EtGhly,pH8.0
Crystal Properties Matthews coefficient Solvent content 2.17 43.39
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 38.85 α = 90 b = 48.31 β = 90 c = 77.64 γ = 90
Symmetry Space Group P 21 21 21
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1 x-ray 80 PIXEL DECTRIS PILATUS 6M 2015-09-07 M SINGLE WAVELENGTH
Radiation Source ID # Source Type Wavelength List Synchrotron Site Beamline 1 SYNCHROTRON SSRF BEAMLINE BL19U1 0.97853 SSRF BL19U1
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) Rrim I (All) Rpim I (All) CC (Half) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1 2 77.64 99.6 0.102 0.111 0.043 0.996 11 6.3 10326
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) R Merge I (Observed) Rrim I (All) Rpim I (All) CC (Half) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 1 2 2.05 99.7 0.435 0.473 0.182 0.946 6.5
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Resolution (High) Resolution (Low) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Free (Depositor) R-Free (DCC) R-Free Selection Details Mean Isotropic B X-RAY DIFFRACTION THROUGHOUT 2 41.02 9732 548 99.33 0.1798 0.1774 0.2233 0.2132 RANDOM 26.673
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3] 4.26 -1 -3.26
RMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 39.777 r_dihedral_angle_4_deg 18.981 r_dihedral_angle_3_deg 16.871 r_dihedral_angle_1_deg 6.315 r_angle_refined_deg 1.839 r_angle_other_deg 1.053 r_chiral_restr 0.117 r_bond_refined_d 0.019 r_gen_planes_refined 0.01 r_bond_other_d 0.002
Show All KeysRMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 39.777 r_dihedral_angle_4_deg 18.981 r_dihedral_angle_3_deg 16.871 r_dihedral_angle_1_deg 6.315 r_angle_refined_deg 1.839 r_angle_other_deg 1.053 r_chiral_restr 0.117 r_bond_refined_d 0.019 r_gen_planes_refined 0.01 r_bond_other_d 0.002 r_gen_planes_other 0.001
Hide All KeysNon-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 1048 Nucleic Acid Atoms Solvent Atoms 60 Heterogen Atoms 40
Software Software Software Name Purpose Aimless data scaling REFMAC refinement PDB_EXTRACT data extraction iMOSFLM data reduction MOLREP phasing