5WKB

MicroED structure of the segment, NFGEFS, from the A315E familial variant of the low complexity domain of TDP-43, residues 312-317


ELECTRON CRYSTALLOGRAPHY

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1Batch7.52981x PBS, pH 7.5

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 42.77α = 90
b = 17.42β = 90
c = 4.9γ = 90
Symmetry
Space GroupP 21 21 2

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11 100CMOSTVIPS F416 CMOS CAMERA2016-08-26
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1ELECTRON MICROSCOPETECNAI F20 TEM0.0251

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)Rrim I (All)CC (Half)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
1121.3988.70.2830.2990.9924.649.4522004-37.454
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R Merge I (Observed)Rrim I (All)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
111.03780.9931.0851.074.809

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodResolution (High)Resolution (Low)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
ELECTRON CRYSTALLOGRAPHYAB INITIO PHASINGTHROUGHOUT121.39180120388.710.22510.22010.2697RANDOM5.061
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
0.180.16-0.34
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg27.684
r_sphericity_free25.539
r_dihedral_angle_3_deg7.324
r_dihedral_angle_1_deg7.068
r_sphericity_bonded3.846
r_rigid_bond_restr1.516
r_angle_refined_deg1.085
r_angle_other_deg0.911
r_chiral_restr0.135
r_bond_refined_d0.016
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg27.684
r_sphericity_free25.539
r_dihedral_angle_3_deg7.324
r_dihedral_angle_1_deg7.068
r_sphericity_bonded3.846
r_rigid_bond_restr1.516
r_angle_refined_deg1.085
r_angle_other_deg0.911
r_chiral_restr0.135
r_bond_refined_d0.016
r_gen_planes_refined0.007
r_bond_other_d0.002
r_gen_planes_other
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms50
Nucleic Acid Atoms
Solvent Atoms2
Heterogen Atoms

Software

Software
Software NamePurpose
XSCALEdata scaling
REFMACrefinement
PDB_EXTRACTdata extraction
XDSdata reduction
Sample
Segment from TDP-43
Specimen Preparation
Sample Aggregation State3D ARRAY
Vitrification Instrument
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodCRYSTALLOGRAPHY
Number of Particles
Reported Resolution (Å)1
Resolution MethodDIFFRACTION PATTERN/LAYERLINES
Other Details
Refinement Type
Symmetry Type3D CRYSTAL
Space Group Name
Length a42.77
Length b17.42
Length c17.42
Angle Alpha90
Angle Beta90
Angle Gamma90
Map-Model Fitting and Refinement
Id1
Refinement Space
Refinement Protocol
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeTVIPS TEMCAM-F416 (4k x 4k)
Electron Dose (electrons/Å**2)3.4
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TECNAI F20
Minimum Defocus (nm)
Maximum Defocus (nm)
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeDIFFRACTION
Specimen Holder ModelGATAN 626 SINGLE TILT LIQUID NITROGEN CRYO TRANSFER HOLDER
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)200
Imaging Details
EM Software
TaskSoftware PackageVersion
IMAGE ACQUISITIONTVIPS F416 CMOS CAMERA
MODEL FITTINGCoot
MODEL REFINEMENTREFMAC
MOLECULAR REPLACEMENTSHELXD
CRYSTALLOGRAPHY MERGINGXSCALE
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
NONE