Find PDB structures and Computed Structure Models (CSM) by combining queries from tools in this suite: Attribute Search, Sequence Similarity, Sequence Motif, 3D Similarity, and 3D Motif with 'AND' logic.
Crystal growth was as described in Kern et al. 2005, Biochim. Biophys. Acta-Bioenergetics and Ibrahim et al. 2015, Struct. Dyn. 2 (4), 041705, substituting C12E8 for beta-DM and Betaine for glycerol
Crystal Properties
Matthews coefficient
Solvent content
3.46
64.49
Crystal Data
Unit Cell
Length ( Å )
Angle ( ˚ )
a = 117.87
α = 90
b = 223.14
β = 90
c = 310.71
γ = 90
Symmetry
Space Group
P 21 21 21
Diffraction
Diffraction Experiment
ID #
Crystal ID
Scattering Type
Data Collection Temperature
Detector
Detector Type
Details
Collection Date
Monochromator
Protocol
1
1
x-ray
293
CCD
RAYONIX MX170-HS
Compound refractive lenses
2015-11-18
M
SINGLE WAVELENGTH
2
1
x-ray
293
CCD
RAYONIX MX170-HS
Compound refractive lenses
2016-07-14
M
SINGLE WAVELENGTH
Radiation Source
ID #
Source
Type
Wavelength List
Synchrotron Site
Beamline
1
FREE ELECTRON LASER
SLAC LCLS BEAMLINE XPP
1.3051
SLAC LCLS
XPP
2
FREE ELECTRON LASER
SLAC LCLS BEAMLINE MFX
1.3051
SLAC LCLS
MFX
Data Collection
Overall
ID #
Resolution (High)
Resolution (Low)
Percent Possible (Observed)
CC (Half)
Net I Over Average Sigma (I)
Redundancy
Number Reflections (All)
Number Reflections (Observed)
Observed Criterion Sigma (F)
Observed Criterion Sigma (I)
B (Isotropic) From Wilson Plot
1
2.25
44.28
99.98
0.974
19.834
158.47
385545
42.9839105609
Highest Resolution Shell
ID #
Resolution (High)
Resolution (Low)
Percent Possible (All)
Percent Possible (Observed)
CC (Half)
Mean I Over Sigma (Observed)
Redundancy
Number Unique Reflections (All)
2.25
2.289
99.98
0.018
2.036
10.37
Refinement
Statistics
Diffraction ID
Structure Solution Method
Cross Validation method
Starting model
Resolution (High)
Resolution (Low)
Cut-off Sigma (F)
Number Reflections (Observed)
Number Reflections (R-Free)
Percent Reflections (Observed)
R-Factor (Observed)
R-Work (Depositor)
R-Free (Depositor)
R-Free Selection Details
Mean Isotropic B
X-RAY DIFFRACTION
MOLECULAR REPLACEMENT
FREE R-VALUE
5KAI
2.25000371562
44.2766212822
1.32535968968
385545
3426
99.933385519
0.193550152737
0.193214944928
0.230881600007
Random selection w.r.t. complete reflections to 2 Angstroms