ELECTRON MICROSCOPY
Refinement
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation |
| r_dihedral_angle_2_deg | 32.264 |
| r_dihedral_angle_3_deg | 16.143 |
| r_dihedral_angle_4_deg | 15.271 |
| r_mcangle_it | 8.107 |
| r_dihedral_angle_1_deg | 5.713 |
| r_mcbond_it | 4.595 |
| r_mcbond_other | 4.595 |
| r_angle_refined_deg | 1.472 |
| r_angle_other_deg | 1.048 |
| r_chiral_restr | 0.087 |
| Sample |
|---|
| Microtubules |
| Specimen Preparation | |
|---|---|
| Sample Aggregation State | FILAMENT |
| Vitrification Instrument | |
| Cryogen Name | ETHANE |
| Sample Vitrification Details | |
| 3D Reconstruction | |
|---|---|
| Reconstruction Method | HELICAL |
| Number of Particles | 10164 |
| Reported Resolution (Å) | 4 |
| Resolution Method | OTHER |
| Other Details | Overall map resolution was 4.2 Angstrom by gold-standard FSCtrue (Chen et al., 2013). The tubulin portion of the map was at higher resolution: at leas ... |
| Refinement Type | |
| Symmetry Type | HELICAL |
| Axial Symmetry | C14 |
| Axial Rise | 8.86 |
| Angular Rotation | -25.71 |
| Data Acquisition | |||||||||
|---|---|---|---|---|---|---|---|---|---|
| Detector Type | DIRECT ELECTRON DE-20 (5k x 3k) | ||||||||
| Electron Dose (electrons/Å**2) | 25 | ||||||||
| Imaging Experiment | 1 |
|---|---|
| Date of Experiment | |
| Temperature (Kelvin) | |
| Microscope Model | FEI POLARA 300 |
| Minimum Defocus (nm) | |
| Maximum Defocus (nm) | |
| Minimum Tilt Angle (degrees) | |
| Maximum Tilt Angle (degrees) | |
| Nominal CS | |
| Imaging Mode | BRIGHT FIELD |
| Specimen Holder Model | |
| Nominal Magnification | |
| Calibrated Magnification | |
| Source | FIELD EMISSION GUN |
| Acceleration Voltage (kV) | 300 |
| Imaging Details |
| Image Processing | ||||
|---|---|---|---|---|
| CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
| PHASE FLIPPING AND AMPLITUDE CORRECTION | ||||
