Structure of the ribosomal 80S-eEF2-sordarin complex from yeast obtained by docking atomic models for RNA and protein components into a 11.7 A cryo-EM map.
ELECTRON MICROSCOPY
| Sample |
|---|
| yeast 80S ribosome |
| Sample Components |
| elongation factor 2 |
| 40S ribosomal protein S0-A |
| 40S ribosomal protein S3 |
| 40S ribosomal protein S9-A |
| 40S ribosomal protein S2 |
| 40S ribosomal protein S5 |
| 40S ribosomal protein S22 |
| 40S ribosomal protein S16 |
| 40S ribosomal protein S20 |
| 40S ribosomal protein S14-A |
| 40S ribosomal protein S23 |
| 40S ribosomal protein S18 |
| 40S ribosomal protein S29-B |
| 40S ribosomal protein S13 |
| 40S ribosomal protein S11 |
| 40S ribosomal protein S15 |
| Specimen Preparation | |
|---|---|
| Sample Aggregation State | PARTICLE |
| Vitrification Instrument | |
| Cryogen Name | ETHANE |
| Sample Vitrification Details | Rapid-freezing in liquid ethane |
| 3D Reconstruction | |
|---|---|
| Reconstruction Method | SINGLE PARTICLE |
| Number of Particles | |
| Reported Resolution (Å) | 11.7 |
| Resolution Method | |
| Other Details | SPIDER package |
| Refinement Type | |
| Symmetry Type | POINT |
| Point Symmetry | C1 |
| Map-Model Fitting and Refinement | |||||
|---|---|---|---|---|---|
| Id | 1 | ||||
| Refinement Space | REAL | ||||
| Refinement Protocol | OTHER | ||||
| Refinement Target | |||||
| Overall B Value | |||||
| Fitting Procedure | |||||
| Details | METHOD--manual fitting in O | ||||
| Data Acquisition | |||||||||
|---|---|---|---|---|---|---|---|---|---|
| Detector Type | KODAK SO-163 FILM | ||||||||
| Electron Dose (electrons/Å**2) | 15 | ||||||||
| Imaging Experiment | 1 |
|---|---|
| Date of Experiment | 2001-02-01 |
| Temperature (Kelvin) | 93 |
| Microscope Model | FEI TECNAI 20 |
| Minimum Defocus (nm) | 4900 |
| Maximum Defocus (nm) | 1400 |
| Minimum Tilt Angle (degrees) | |
| Maximum Tilt Angle (degrees) | |
| Nominal CS | |
| Imaging Mode | BRIGHT FIELD |
| Specimen Holder Model | |
| Nominal Magnification | 50000 |
| Calibrated Magnification | 52000 |
| Source | FIELD EMISSION GUN |
| Acceleration Voltage (kV) | 200 |
| Imaging Details |
| Image Processing | ||||
|---|---|---|---|---|
| CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
| CTF correction of 3D-maps by Wiener filtration | ||||
