X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION, HANGING DROP5.52930.1M Bis-Tris, 1.45M ammonium sulfate, 0.1M sodium chloride, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Crystal Properties
Matthews coefficientSolvent content
3.7266.92

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 107.021α = 90
b = 143.479β = 90
c = 172.768γ = 90
Symmetry
Space GroupP 21 21 21

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100CCDMARMOSAIC 225 mm CCDMSINGLE WAVELENGTH
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONSSRF BEAMLINE BL17U0.9796SSRFBL17U

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)R Sym I (Observed)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
12501000.0980.11228.57.11791871791871123.581
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R Merge I (Observed)R-Sym I (Observed)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
122.031000.3190.2975.236.18882

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodStarting modelResolution (High)Resolution (Low)Number Reflections (All)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (All)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONMOLECULAR REPLACEMENTTHROUGHOUT4DNZ243.67170357169438893999.460.1690.155450.153690.18886RANDOM23.518
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
0.42-1.370.95
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg33.899
r_dihedral_angle_4_deg18.022
r_dihedral_angle_3_deg12.698
r_dihedral_angle_1_deg6.015
r_scangle_it5.911
r_scbond_it3.831
r_mcangle_it2.178
r_angle_refined_deg2.091
r_mcbond_it1.33
r_chiral_restr0.185
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg33.899
r_dihedral_angle_4_deg18.022
r_dihedral_angle_3_deg12.698
r_dihedral_angle_1_deg6.015
r_scangle_it5.911
r_scbond_it3.831
r_mcangle_it2.178
r_angle_refined_deg2.091
r_mcbond_it1.33
r_chiral_restr0.185
r_bond_refined_d0.031
r_gen_planes_refined0.014
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms12084
Nucleic Acid Atoms
Solvent Atoms2197
Heterogen Atoms269

Software

Software
Software NamePurpose
HKL-2000data collection
CCP4model building
REFMACrefinement
HKL-2000data reduction
HKL-2000data scaling
CCP4phasing