X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION, SITTING DROP7.529812%PEG3350, 0.5M NaAcetate, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 298K
2VAPOR DIFFUSION, SITTING DROP7.529812%PEG3350, 0.5M NaAcetate, 200uM EtHgPhosphate, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 140.534α = 90
b = 68.651β = 90
c = 73.761γ = 90
Symmetry
Space GroupP 21 21 2

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100CCDRAYONIX MX-3252009-05-30MSINGLE WAVELENGTH
22x-ray100CCDRAYONIX MX-3252009-05-30MMAD
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONSSRL BEAMLINE BL12-20.80011,0.7336,1.00961SSRLBL12-2
2SYNCHROTRONSSRL BEAMLINE BL12-20.7336,1.00961SSRLBL12-2

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
1,21.65094.50.0589.96.889654
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R Merge I (Observed)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
1,21.61.6568.30.6643.75307

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodResolution (High)Resolution (Low)Cut-off Sigma (F)Number Reflections (All)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONMADTHROUGHOUT1.639.541.39487784968452494.430.15950.15780.1911RANDOM24.417
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
-0.660.73-0.07
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg30.149
r_dihedral_angle_4_deg20.621
r_dihedral_angle_3_deg14.115
r_dihedral_angle_1_deg6.57
r_scangle_it5.201
r_scbond_it3.434
r_mcangle_it2.496
r_mcbond_it1.584
r_angle_refined_deg1.482
r_chiral_restr0.13
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg30.149
r_dihedral_angle_4_deg20.621
r_dihedral_angle_3_deg14.115
r_dihedral_angle_1_deg6.57
r_scangle_it5.201
r_scbond_it3.434
r_mcangle_it2.496
r_mcbond_it1.584
r_angle_refined_deg1.482
r_chiral_restr0.13
r_gen_planes_refined0.016
r_bond_refined_d0.014
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms4992
Nucleic Acid Atoms
Solvent Atoms712
Heterogen Atoms

Software

Software
Software NamePurpose
DENZOdata reduction
SCALEPACKdata scaling
SHELXphasing
DMphasing
REFMACrefinement
PDB_EXTRACTdata extraction
HKL-2000data collection
HKL-2000data reduction
HKL-2000data scaling
SHELXDphasing