ELECTRON MICROSCOPY
Starting Model(s)
| Initial Refinement Model(s) | |||
|---|---|---|---|
| Type | Source | Accession Code | Details |
| experimental model | PDB | 1AON | |
| Sample |
|---|
| GROEL VARIANT EL43PY CAPPED BY GROES WITH THE ASSISTANCE OF NUCLEOTIDE ATP |
| Specimen Preparation | |
|---|---|
| Sample Aggregation State | PARTICLE |
| Vitrification Instrument | FEI VITROBOT MARK III |
| Cryogen Name | ETHANE |
| Sample Vitrification Details | VITRIFICATION 1 -- CRYOGEN- ETHANE, HUMIDITY- 95, TEMPERATURE- 98, INSTRUMENT- FEI VITROBOT MARK III, METHOD- BLOT FOR 1 SECOND BEFORE PLUNGING, |
| 3D Reconstruction | |
|---|---|
| Reconstruction Method | SINGLE PARTICLE |
| Number of Particles | 8372 |
| Reported Resolution (Å) | 8.9 |
| Resolution Method | |
| Other Details | SUBMISSION BASED ON EXPERIMENTAL DATA FROM EMDB EMD-2325. (DEPOSITION ID: 11454). |
| Refinement Type | |
| Symmetry Type | POINT |
| Point Symmetry | C7 |
| Map-Model Fitting and Refinement | |||||
|---|---|---|---|---|---|
| Id | 1 (1AON) | ||||
| Refinement Space | REAL | ||||
| Refinement Protocol | FLEXIBLE FIT | ||||
| Refinement Target | Cross-correlation coefficient | ||||
| Overall B Value | |||||
| Fitting Procedure | |||||
| Details | METHOD--FLEXIBLE REFINEMENT PROTOCOL--X-RAY | ||||
| Data Acquisition | |||||||||
|---|---|---|---|---|---|---|---|---|---|
| Detector Type | KODAK SO-163 FILM | ||||||||
| Electron Dose (electrons/Å**2) | 36 | ||||||||
| Imaging Experiment | 1 |
|---|---|
| Date of Experiment | 2007-03-07 |
| Temperature (Kelvin) | 11 |
| Microscope Model | JEOL KYOTO-3000SFF |
| Minimum Defocus (nm) | 1200 |
| Maximum Defocus (nm) | 3500 |
| Minimum Tilt Angle (degrees) | |
| Maximum Tilt Angle (degrees) | |
| Nominal CS | 1.6 |
| Imaging Mode | OTHER |
| Specimen Holder Model | |
| Nominal Magnification | 60000 |
| Calibrated Magnification | 61060 |
| Source | FIELD EMISSION GUN |
| Acceleration Voltage (kV) | 300 |
| Imaging Details |
| EM Software | ||
|---|---|---|
| Task | Software Package | Version |
| MODEL FITTING | DireX | |
| RECONSTRUCTION | EMAN | 1 |
| Image Processing | ||||
|---|---|---|---|---|
| CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
| EACH MICROGRAPH | ||||
