3IZ2
C-alpha model fitted into the EM structure of Cx26M34Adel2-7
ELECTRON CRYSTALLOGRAPHY
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) |
| a = 113.4 | α = 90 |
| b = 112.2 | β = 90 |
| c = 300 | γ = 90 |
| Symmetry | |
|---|---|
| Space Group | P 21 21 2 |
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | electron | M | SINGLE WAVELENGTH | ||||||||||
Refinement
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number |
| Protein Atoms | 555 |
| Nucleic Acid Atoms | |
| Solvent Atoms | |
| Heterogen Atoms | |
| Sample |
|---|
| connexin26 gap junction channels |
| Specimen Preparation | |
|---|---|
| Sample Aggregation State | 2D ARRAY |
| Vitrification Instrument | REICHERT-JUNG PLUNGER |
| Cryogen Name | NITROGEN |
| Sample Vitrification Details | |
| Embedding Material | trehalose |
| Embedding Details | 10% trehalose |
| 3D Reconstruction | |
|---|---|
| Reconstruction Method | CRYSTALLOGRAPHY |
| Number of Particles | |
| Reported Resolution (Å) | 10 |
| Resolution Method | |
| Other Details | |
| Refinement Type | |
| Symmetry Type | 2D CRYSTAL |
| Map-Model Fitting and Refinement | |||||
|---|---|---|---|---|---|
| Id | 1 (2ZW3) | ||||
| Refinement Space | REAL | ||||
| Refinement Protocol | RIGID BODY FIT | ||||
| Refinement Target | Cross-correlation coefficient | ||||
| Overall B Value | |||||
| Fitting Procedure | |||||
| Details | REFINEMENT PROTOCOL--Rigid body DETAILS--Initial local fitting was done using O, and Situs was used for flexible fitting. | ||||
| Data Acquisition | |||||||||
|---|---|---|---|---|---|---|---|---|---|
| Detector Type | KODAK SO-163 FILM | ||||||||
| Electron Dose (electrons/Å**2) | 25 | ||||||||
| Imaging Experiment | 1 |
|---|---|
| Date of Experiment | 2007-11-09 |
| Temperature (Kelvin) | 4.2 |
| Microscope Model | JEOL KYOTO-3000SFF |
| Minimum Defocus (nm) | 544 |
| Maximum Defocus (nm) | 2214 |
| Minimum Tilt Angle (degrees) | |
| Maximum Tilt Angle (degrees) | 45 |
| Nominal CS | 1.6 |
| Imaging Mode | BRIGHT FIELD |
| Specimen Holder Model | |
| Nominal Magnification | 40000 |
| Calibrated Magnification | 39000 |
| Source | FIELD EMISSION GUN |
| Acceleration Voltage (kV) | 300 |
| Imaging Details |
| EM Software | ||
|---|---|---|
| Task | Software Package | Version |
| MODEL FITTING | Situs | |
| RECONSTRUCTION | MRC | |
| Image Processing | ||||
|---|---|---|---|---|
| CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
| Each image | ||||
