X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION7.52980.9M sodium citrate, 0.1M HEPES pH 7.5, VAPOR DIFFUSION, temperature 298K
Crystal Properties
Matthews coefficientSolvent content
5.6278.1

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 302.04α = 90
b = 302.04β = 90
c = 112.12γ = 120
Symmetry
Space GroupH 3

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100CCDCUSTOM-MADE2004-02-11MSINGLE WAVELENGTH
21CCDCUSTOM-MADE2004-08-19
31CCDADSC QUANTUM 2102004-11-23
41CCDADSC QUANTUM 2102004-11-23
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONAPS BEAMLINE 19-BM1.0332APS19-BM
2SYNCHROTRONAPS BEAMLINE 19-BM1.0719APS19-BM
3SYNCHROTRONALS BEAMLINE 8.2.11.1401,1.1405,1.1390ALS8.2.1
4SYNCHROTRONALS BEAMLINE 8.2.11.8000ALS8.2.1

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Sym I (Observed)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
12.9501000.07214.4844988449871.5
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R-Sym I (Observed)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
12.931000.5593.44.38439

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodResolution (High)Resolution (Low)Number Reflections (All)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (All)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONMAD+MIRASTHROUGHOUT2.9508025180251422699.950.190660.190660.189120.21997RANDOM77.431
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
0.70.350.7-1.05
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg36.6
r_dihedral_angle_4_deg18.218
r_dihedral_angle_3_deg17.969
r_dihedral_angle_1_deg6.577
r_scangle_it2.132
r_angle_refined_deg1.331
r_scbond_it1.319
r_mcangle_it0.778
r_mcbond_it0.419
r_nbtor_refined0.312
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg36.6
r_dihedral_angle_4_deg18.218
r_dihedral_angle_3_deg17.969
r_dihedral_angle_1_deg6.577
r_scangle_it2.132
r_angle_refined_deg1.331
r_scbond_it1.319
r_mcangle_it0.778
r_mcbond_it0.419
r_nbtor_refined0.312
r_nbd_refined0.216
r_symmetry_vdw_refined0.158
r_xyhbond_nbd_refined0.143
r_metal_ion_refined0.134
r_symmetry_hbond_refined0.117
r_chiral_restr0.096
r_bond_refined_d0.012
r_gen_planes_refined0.004
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms12341
Nucleic Acid Atoms
Solvent Atoms
Heterogen Atoms7

Software

Software
Software NamePurpose
REFMACrefinement
HKL-2000data reduction
HKL-2000data scaling
SHARPphasing