X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
18.5200mM NaCl, 100mM Tris pH8.5, 30% PEG 3400
Crystal Properties
Matthews coefficientSolvent content
2.0344.77

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 61.164α = 90
b = 77.904β = 90
c = 96.171γ = 90
Symmetry
Space GroupP 21 21 21

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray MSINGLE WAVELENGTH
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRON1.0ALS8.2.2

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
11.345095462

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodStarting modelResolution (High)Resolution (Low)Number Reflections (All)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (All)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONAB INITIOFREE RPDB entry 1G7K1.34109068569658477787.80.18340.18340.18340.2647RANDOM
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
Coordinate Error
Structure Solution MethodRefinement High ResolutionRefinement Low Resolution
43935
RMS Deviations
KeyRefinement Restraint Deviation
s_approx_iso_adps0.102
s_non_zero_chiral_vol0.067
s_similar_adp_cmpnt0.064
s_zero_chiral_vol0.057
s_from_restr_planes0.0311
s_angle_d0.031
s_anti_bump_dis_restr0.013
s_bond_d0.011
s_rigid_bond_adp_cmpnt0.004
s_similar_dist
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms3471
Nucleic Acid Atoms
Solvent Atoms480
Heterogen Atoms

Software

Software
Software NamePurpose
SHELXL-97refinement
TNTrefinement
HKL-2000data reduction
HKL-2000data scaling
SHELXphasing
HKL-2000data collection