1MHS

Model of Neurospora crassa proton ATPase


ELECTRON CRYSTALLOGRAPHY

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 167α = 90
b = 167β = 90
c = 250γ = 120
Symmetry
Space GroupP 3 2 1

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11electron

Refinement

Statistics
Diffraction IDStructure Solution MethodResolution (High)Resolution (Low)Number Reflections (R-Free)Percent Reflections (Observed)R-WorkR-FreeMean Isotropic B
ELECTRON CRYSTALLOGRAPHY8
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms14082
Nucleic Acid Atoms
Solvent Atoms
Heterogen Atoms
Sample
Neurospora ATPase hexamer crystal
Sample Components
plasma membrane proton ATPase hexameric assembly
Specimen Preparation
Sample Aggregation State2D ARRAY
Vitrification Instrument
Cryogen Name
Sample Vitrification Details2D crystals were vitrified by immersion in liquid nitrogen
3D Reconstruction
Reconstruction MethodCRYSTALLOGRAPHY
Number of Particles
Reported Resolution (Å)8
Resolution Method
Other Details
Refinement Type
Symmetry Type2D CRYSTAL
Map-Model Fitting and Refinement
Id1
Refinement SpaceREAL
Refinement ProtocolOTHER
Refinement Targetbest visual fit using the program o
Overall B Value
Fitting Procedure
DetailsMETHOD--manual REFINEMENT PROTOCOL--manual fit
Data Acquisition
Detector TypeKODAK SO-163 FILM
Electron Dose (electrons/Å**2)25
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)4
Microscope ModelJEOL 3000SFF
Minimum Defocus (nm)600
Maximum Defocus (nm)1200
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)60
Nominal CS1.6
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification50000
Calibrated Magnification50000
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging DetailsImages were also recorded on JEOL 2000 EX and Philips CM200 FEG electron microscopes at 80 K at a dose of 1000 e/nm**2
EM Software
TaskSoftware PackageVersion
RECONSTRUCTIONMRC
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
crystallographic