7UZZ

Staphylococcus epidermidis RP62a CRISPR tall effector complex


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d16.321
f_angle_d0.763
f_chiral_restr0.045
f_bond_d0.007
f_plane_restr0.005
Sample
Staphylococcus epidermidis RP62a CRISPR tall effector complex
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentSPOTITON
Cryogen NameETHANE
Sample Vitrification DetailsGrids were prepared at the National Center for CryoEM Access and Training (NCCAT) using a Chameleon (SPT Labtech) blotless system. 300 mesh nanowire g ...Grids were prepared at the National Center for CryoEM Access and Training (NCCAT) using a Chameleon (SPT Labtech) blotless system. 300 mesh nanowire grids with multi-hole pattern carbon film and a thin layer of gold coating (~ 5 nm) (SPT Labtech)were used
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles101620
Reported Resolution (Å)4.45
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Point SymmetryC1
Map-Model Fitting and Refinement
Id1 (6NBT, 6NBT, 6NBT, 6NBT, 6NBU, 6NBU, 6NBU)
Refinement SpaceREAL
Refinement ProtocolOTHER
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K3 (6k x 4k)
Electron Dose (electrons/Å**2)61.07
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelTFS KRIOS
Minimum Defocus (nm)800
Maximum Defocus (nm)2500
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification
Calibrated Magnification46772
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONcryoSPARC
IMAGE ACQUISITIONLeginon
CTF CORRECTIONcryoSPARC
MODEL FITTINGUCSF Chimera
MODEL REFINEMENTPHENIX1.18.2
INITIAL EULER ASSIGNMENTcryoSPARC
FINAL EULER ASSIGNMENTcryoSPARC
CLASSIFICATIONcryoSPARC
RECONSTRUCTIONcryoSPARC
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION1982259