7T62

GPC2 HEP CT3 complex


ELECTRON MICROSCOPY
Sample
GPC2 HET CT3 complex
Specimen Preparation
Sample Aggregation StatePARTICLE
Staining TypeNEGATIVE
Staining Materialuranyl formate
Staining DetailsA 3 uL aliquot containing ~0.01 mg/mL of the samples was applied for 20 s onto a carbon-coated 200 Cu mesh grid (Electron Microscopy Sciences, Protoch ...A 3 uL aliquot containing ~0.01 mg/mL of the samples was applied for 20 s onto a carbon-coated 200 Cu mesh grid (Electron Microscopy Sciences, Protochips, Inc.) that had been glow discharged at 30 mA for 30 s (Pelco easiGlow, Ted Pella, Inc.), then negatively stained with 0.7% (w/v) uranyl formate for 40 sec.
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles21000
Reported Resolution (Å)21
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Point SymmetryC1
Map-Model Fitting and Refinement
Id1
Refinement Space
Refinement Protocol
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeFEI EAGLE (2k x 2k)
Electron Dose (electrons/Å**2)40
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TECNAI 20
Minimum Defocus (nm)2000
Maximum Defocus (nm)5000
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification100000
Calibrated Magnification
SourceLAB6
Acceleration Voltage (kV)200
Imaging Details
EM Software
TaskSoftware PackageVersion
IMAGE ACQUISITIONSerialEM
INITIAL EULER ASSIGNMENTRELION3.08
FINAL EULER ASSIGNMENTRELION3.08
CLASSIFICATIONRELION3.08
RECONSTRUCTIONRELION3.08
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
NONE21000