X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION, HANGING DROP5.52931.7M Ammonium Sulfate, 0.1M Sodium Citrate, pH 5.5
Crystal Properties
Matthews coefficientSolvent content
5.376.77

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 131.616α = 90
b = 131.616β = 90
c = 257.066γ = 90
Symmetry
Space GroupI 41 2 2

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100PIXELDECTRIS PILATUS 6MMirror: Flat Si Rh coated M0, Kirkpatrick-Baez flat bent Si M1 & M2018-11-10MSINGLE WAVELENGTH
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONSSRL BEAMLINE BL12-20.9795SSRLBL12-2

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)Rrim I (All)Rpim I (All)CC (Half)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
13.2538.9299.80.0780.0820.0250.99918.210.718198
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R Merge I (Observed)Rrim I (All)Rpim I (All)CC (Half)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
13.253.5199.81.4111.4810.4450.91910.9

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodStarting modelResolution (High)Resolution (Low)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONMOLECULAR REPLACEMENTTHROUGHOUT2GK23.2538.951722693599.650.21940.2180.2441RANDOM149.92
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
-8.92-8.9217.85
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg40.794
r_dihedral_angle_3_deg19.852
r_dihedral_angle_4_deg18.736
r_dihedral_angle_1_deg8.848
r_angle_refined_deg1.422
r_angle_other_deg1.095
r_chiral_restr0.048
r_bond_refined_d0.004
r_gen_planes_refined0.004
r_bond_other_d0.001
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg40.794
r_dihedral_angle_3_deg19.852
r_dihedral_angle_4_deg18.736
r_dihedral_angle_1_deg8.848
r_angle_refined_deg1.422
r_angle_other_deg1.095
r_chiral_restr0.048
r_bond_refined_d0.004
r_gen_planes_refined0.004
r_bond_other_d0.001
r_gen_planes_other0.001
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms3311
Nucleic Acid Atoms
Solvent Atoms1
Heterogen Atoms37

Software

Software
Software NamePurpose
REFMACrefinement
XDSdata reduction
Aimlessdata scaling
MOLREPphasing
PDB_EXTRACTdata extraction