3JCK
Structure of the yeast 26S proteasome lid sub-complex
ELECTRON MICROSCOPY
Sample |
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Recombinant yeast 26S proteasome lid complex |
Sample Components |
26S proteasome lid sub-complex |
Specimen Preparation | |
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Sample Aggregation State | PARTICLE |
Vitrification Instrument | HOMEMADE PLUNGER |
Cryogen Name | ETHANE |
Sample Vitrification Details | 4 uL sample was applied to the grid, blotted for 2 seconds at 4 degrees C, and plunged into liquid ethane using a manual plunger. |
3D Reconstruction | |
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Reconstruction Method | SINGLE PARTICLE |
Number of Particles | 109396 |
Reported Resolution (Å) | 3.5 |
Resolution Method | FSC 0.143 CUT-OFF |
Other Details | 3D classification was performed to identify the best 109,396 particles from an initial dataset of 254,112. An ensemble of five models is provided. Ea ... |
Refinement Type | |
Symmetry Type | POINT |
Point Symmetry | C1 |
Map-Model Fitting and Refinement | |||||
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Id | 1 | ||||
Refinement Space | |||||
Refinement Protocol | |||||
Refinement Target | |||||
Overall B Value | |||||
Fitting Procedure | |||||
Details |
Data Acquisition | |||||||||
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Detector Type | GATAN K2 (4k x 4k) | ||||||||
Electron Dose (electrons/Å**2) | 43.8 |
Imaging Experiment | 1 |
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Date of Experiment | 2015-02-10 |
Temperature (Kelvin) | 87.5 |
Microscope Model | FEI TITAN KRIOS |
Minimum Defocus (nm) | 1600 |
Maximum Defocus (nm) | 3200 |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | 2.7 |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | FEI TITAN KRIOS AUTOGRID HOLDER |
Nominal Magnification | 22500 |
Calibrated Magnification | 38168 |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 300 |
Imaging Details | Micrograph was collected in super-resolution mode with a total frame count of 38 and total exposure time of 7.6 seconds. |
EM Software | ||
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Task | Software Package | Version |
CTF CORRECTION | CTFFIND | 3 |
PARTICLE SELECTION | FindEM | |
RECONSTRUCTION | Appion | |
RECONSTRUCTION | RELION |
Image Processing | ||||
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CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
whole micrograph |