3DWU
Transition-state model conformation of the switch I region fitted into the cryo-EM map of the eEF2.80S.AlF4.GDP complex
ELECTRON MICROSCOPY
Sample |
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eEF2.80S.AlF4.GDP complex |
Specimen Preparation | |
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Sample Aggregation State | PARTICLE |
Vitrification Instrument | FEI VITROBOT MARK I |
Cryogen Name | NITROGEN |
Sample Vitrification Details | Cryogen ETHANE (93K), two-face blotting for 1 second |
3D Reconstruction | |
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Reconstruction Method | SINGLE PARTICLE |
Number of Particles | 28242 |
Reported Resolution (Å) | 12.6 |
Resolution Method | FSC |
Other Details | Single particle reconstruction, resolution estimated: FSC cut-off at 0.15 |
Refinement Type | |
Symmetry Type | POINT |
Point Symmetry | C1 |
Map-Model Fitting and Refinement | |||||
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Id | 1 (3DNY) | ||||
Refinement Space | REAL | ||||
Refinement Protocol | RIGID BODY FIT | ||||
Refinement Target | correlation coefficient | ||||
Overall B Value | |||||
Fitting Procedure | |||||
Details | METHOD--manual REFINEMENT PROTOCOL--Fitted as rigid body. Current model was aligned to the helix A of the fitted eEF2 coordinates (PDB entry 3DNY) wh ... |
Data Acquisition | |||||||||
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Detector Type | |||||||||
Electron Dose (electrons/Å**2) | 10 |
Imaging Experiment | 1 |
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Date of Experiment | |
Temperature (Kelvin) | |
Microscope Model | FEI TECNAI F20 |
Minimum Defocus (nm) | 1500 |
Maximum Defocus (nm) | 4500 |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | |
Nominal Magnification | 50000 |
Calibrated Magnification | 49650 |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 200 |
Imaging Details |
EM Software | ||
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Task | Software Package | Version |
MODEL FITTING | O | |
RECONSTRUCTION | SPIDER |
Image Processing | ||||
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CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
segregation in defocus groups and correction in volumes |