9V43 | pdb_00009v43

Cryo-EM structure of DICER/26S-UG complex in dicing state


ELECTRON MICROSCOPY

Starting Model(s)

Initial Refinement Model(s)
TypeSourceAccession CodeDetails
experimental modelPDB 7XW2 

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d13.079
f_angle_d0.838
f_chiral_restr0.042
f_plane_restr0.008
f_bond_d0.005
Sample
Complex of DICER/26S-UG in dicing state
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification Instrument
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles641317
Reported Resolution (Å)3.34
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Map-Model Fitting and Refinement
Id1 (7XW2)
Refinement Space
Refinement ProtocolOTHER
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeTFS FALCON 4i (4k x 4k)
Electron Dose (electrons/Å**2)50
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelTFS KRIOS
Minimum Defocus (nm)1200
Maximum Defocus (nm)2300
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeOTHER
Specimen Holder Model
Nominal Magnification84000
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONcryoSPARC4.6.2
CTF CORRECTIONcryoSPARC4.6.2
MODEL FITTINGUCSF ChimeraX1.7
INITIAL EULER ASSIGNMENTcryoSPARC4.6.2
FINAL EULER ASSIGNMENTcryoSPARC4.6.2
RECONSTRUCTIONcryoSPARC4.6.2
MODEL REFINEMENTPHENIX1.20.1_4487
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION