Outer Curvature of Thick Flagellar Filament from T.denticola
ELECTRON MICROSCOPY
Refinement
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation |
| f_dihedral_angle_d | 14.6456 |
| f_angle_d | 0.5055 |
| f_chiral_restr | 0.0402 |
| f_plane_restr | 0.0024 |
| f_bond_d | 0.0012 |
| Sample |
|---|
| FlaA1 region of the outer sheath (located at the outer curvature) of thick flagellar filaments purified from planktonic T. denticola |
| Specimen Preparation | |
|---|---|
| Sample Aggregation State | PARTICLE |
| Vitrification Instrument | LEICA EM GP |
| Cryogen Name | ETHANE |
| Sample Vitrification Details | The sample was back blotted |
| 3D Reconstruction | |
|---|---|
| Reconstruction Method | HELICAL |
| Number of Particles | 56413 |
| Reported Resolution (Å) | 2.7 |
| Resolution Method | FSC 0.143 CUT-OFF |
| Other Details | This is reconstructed from pseudo-particles following symmetry expansion of 56413 particles by 6 assymmetric units with relion_particle_symmetry_expan ... |
| Refinement Type | |
| Symmetry Type | POINT |
| Axial Symmetry | C1 |
| Axial Rise | 0.001 |
| Angular Rotation | |
| Map-Model Fitting and Refinement | |||||
|---|---|---|---|---|---|
| Id | 1 | ||||
| Refinement Space | REAL | ||||
| Refinement Protocol | OTHER | ||||
| Refinement Target | |||||
| Overall B Value | |||||
| Fitting Procedure | |||||
| Details | ModelAngelo automated the model builder was used to generate the initial model for refinement. This first given the full proteome for T.denticola and ... | ||||
| Data Acquisition | |||||||||
|---|---|---|---|---|---|---|---|---|---|
| Detector Type | GATAN K3 (6k x 4k) | ||||||||
| Electron Dose (electrons/Å**2) | 57.7 | ||||||||
| Imaging Experiment | 1 |
|---|---|
| Date of Experiment | |
| Temperature (Kelvin) | |
| Microscope Model | TFS KRIOS |
| Minimum Defocus (nm) | 500 |
| Maximum Defocus (nm) | 1800 |
| Minimum Tilt Angle (degrees) | |
| Maximum Tilt Angle (degrees) | |
| Nominal CS | 2.7 |
| Imaging Mode | BRIGHT FIELD |
| Specimen Holder Model | FEI TITAN KRIOS AUTOGRID HOLDER |
| Nominal Magnification | 105000 |
| Calibrated Magnification | |
| Source | FIELD EMISSION GUN |
| Acceleration Voltage (kV) | 300 |
| Imaging Details |
| EM Software | ||
|---|---|---|
| Task | Software Package | Version |
| PARTICLE SELECTION | crYOLO | 1.9.9 |
| MODEL REFINEMENT | PHENIX | 1.21.2_5419 |
| RECONSTRUCTION | RELION | 5.0 |
| Image Processing | ||||
|---|---|---|---|---|
| CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
| NONE | 665964 | Particle picking using crYOLO filament picker. | ||
