9LS0 | pdb_00009ls0

Straight and symmetrical filament of the spirochete periplasmic flagella of Leptospira biflexa deleted fcpB strain


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d4.569
f_angle_d0.492
f_chiral_restr0.037
f_bond_d0.003
f_plane_restr0.003
Sample
Straight and symmetrical filament of the spirochete periplasmic flagella from deleted fcpB strain
Specimen Preparation
Sample Aggregation StateFILAMENT
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodHELICAL
Number of Particles203738
Reported Resolution (Å)2.4
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypeHELICAL
Axial SymmetryC1
Axial Rise4.81
Angular Rotation65.439
Map-Model Fitting and Refinement
Id1
Refinement SpaceREAL
Refinement ProtocolFLEXIBLE FIT
Refinement Target
Overall B Value50.5914
Fitting Procedure
Details
Data Acquisition
Detector TypeFEI FALCON III (4k x 4k)
Electron Dose (electrons/Å**2)50
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelTFS KRIOS
Minimum Defocus (nm)500
Maximum Defocus (nm)2000
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS0.01
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification59000
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
IMAGE ACQUISITIONEPU
CTF CORRECTIONGctf
MODEL FITTINGCoot
INITIAL EULER ASSIGNMENTRELION3.1.3
FINAL EULER ASSIGNMENTRELION3.1.3
CLASSIFICATIONRELION3.1.3
RECONSTRUCTIONRELION3.1.3
MODEL REFINEMENTPHENIX1.21.1_5286
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING ONLY