8IBN

Cryo-EM structure of KpFtsZ single filament


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d7.627
f_angle_d0.822
f_chiral_restr0.055
f_plane_restr0.005
f_bond_d0.004
Sample
Cryo-EM structure of KpFtsZ single filament
Sample Components
KpFtsZ
Specimen Preparation
Sample Aggregation StateFILAMENT
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodHELICAL
Number of Particles551739
Reported Resolution (Å)3.03
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypeHELICAL
Axial SymmetryC1
Axial Rise44.02
Angular Rotation0.025
Map-Model Fitting and Refinement
Id1 (6LL5)
Refinement SpaceREAL
Refinement Protocol
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K3 (6k x 4k)
Electron Dose (electrons/Å**2)60
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelJEOL CRYO ARM 300
Minimum Defocus (nm)500
Maximum Defocus (nm)2000
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder ModelJEOL CRYOSPECPORTER
Nominal Magnification60000
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONcryoSPARC4.1.1
IMAGE ACQUISITIONSerialEM4.0
CTF CORRECTIONcryoSPARC4.1.1
MODEL FITTINGUCSF Chimera1.15
INITIAL EULER ASSIGNMENTcryoSPARC4.1.1
FINAL EULER ASSIGNMENTcryoSPARC4.1.1
RECONSTRUCTIONcryoSPARC4.1.1
MODEL REFINEMENTPHENIX1.19.2
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION3695707