7TR1

CaKip3[2-436]-L2-mutant(HsKHC) - AMP-PNP in complex with a microtubule


ELECTRON MICROSCOPY
Sample
CaKip3[2-436]-L2-mutant(HsKHC) - AMP-PNP in complex with a microtubule
Sample Components
CaKip3[2-436] with L2 swapped with the one of HsKHC, bound to AMP-PNP
15R microtubule
Specimen Preparation
Sample Aggregation StateFILAMENT
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodHELICAL
Number of Particles67238
Reported Resolution (Å)3.1
Resolution MethodFSC 0.143 CUT-OFF
Other Details2 half datasets containing one distinct half of each filament were refined independently. Number of asymmetric units used is reported in "number of s ...2 half datasets containing one distinct half of each filament were refined independently. Number of asymmetric units used is reported in "number of segments used", due to the local processing strategy employed.
Refinement Type
Symmetry TypeHELICAL
Axial SymmetryC1
Axial Rise5.54
Angular Rotation168.084
Map-Model Fitting and Refinement
Id1
Refinement SpaceREAL
Refinement ProtocolFLEXIBLE FIT
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å**2)64
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)800
Maximum Defocus (nm)1750
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
IMAGE ACQUISITIONLeginonbeta
CTF CORRECTIONRELION3.1
MODEL FITTINGRosettaEM
MODEL FITTINGPHENIX
MODEL FITTINGMODELLER
MODEL FITTINGUCSF Chimera
MODEL FITTINGCoot
INITIAL EULER ASSIGNMENTSPIDER22.10
FINAL EULER ASSIGNMENTRELION3.1
RECONSTRUCTIONRELION3.1
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTIONmanual picking of filaments