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Cryo-EM structure of M4008_N1 Fab in complex with BG505 DS-SOSIP.664 Env trimer
Starting Model(s) Initial Refinement Model(s) Type Source Accession Code Details experimental model PDB 5U1F experimental model PDB 4OAW
Refinement RMS Deviations Key Refinement Restraint Deviation f_dihedral_angle_d 22.546 f_angle_d 0.667 f_chiral_restr 0.047 f_bond_d 0.007 f_plane_restr 0.004
Sample M4008_N1 Fab in complex with BG505 DS-SOSIP.664 Env trimer
Specimen Preparation Sample Aggregation State PARTICLE Vitrification Instrument Cryogen Name ETHANE Sample Vitrification Details
3D Reconstruction Reconstruction Method SINGLE PARTICLE Number of Particles 281313 Reported Resolution (Å) 3.24 Resolution Method FSC 0.143 CUT-OFF Other Details Refinement Type Symmetry Type POINT Point Symmetry C3
Map-Model Fitting and Refinement Id 1 (5U1F, 5U1F, 4OAW, 4OAW) Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Details
Data Acquisition Detector Type GATAN K2 SUMMIT (4k x 4k) Electron Dose (electrons/Å**2) 58.07
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model TFS KRIOS Minimum Defocus (nm) Maximum Defocus (nm) Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode BRIGHT FIELD Specimen Holder Model Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 300 Imaging Details
EM Software Task Software Package Version CTF CORRECTION CTFFIND 4 MODEL FITTING UCSF Chimera 1.13.1 CLASSIFICATION cryoSPARC 2.15.0 RECONSTRUCTION cryoSPARC 2.15.0 MODEL REFINEMENT cryoSPARC 2.15.0
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details PHASE FLIPPING AND AMPLITUDE CORRECTION