6U5G

MicroED structure of a FIB-milled CypA Crystal


ELECTRON CRYSTALLOGRAPHY

Crystallization

Crystal Properties
Matthews coefficientSolvent content
2.7555.34

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 42.4α = 90
b = 53.4β = 90
c = 87.76γ = 90
Symmetry
Space GroupP 21 21 21

Data Collection

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodStarting modelResolution (High)Resolution (Low)Cut-off Sigma (F)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeMean Isotropic B
ELECTRON CRYSTALLOGRAPHYMOLECULAR REPLACEMENTFREE R-VALUEPDB entry 4YUM2.526.481.341144039686.010.18670.18540.223730.6
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d12.8187
f_angle_d0.7321
f_chiral_restr0.0545
f_bond_d0.0112
f_plane_restr0.0053

Software

Software
Software NamePurpose
PHENIXrefinement
PHASERphasing
XDSdata scaling
XDSdata reduction
Sample
Peptidyl-prolyl cis-trans isomerase A
Specimen Preparation
Sample Aggregation State3D ARRAY
Vitrification Instrument
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodCRYSTALLOGRAPHY
Number of Particles
Reported Resolution (Å)2.5
Resolution MethodDIFFRACTION PATTERN/LAYERLINES
Other Details
Refinement Type
Symmetry Type3D CRYSTAL
Space Group Name
Length a42.4
Length b53.4
Length c53.4
Angle Alpha90
Angle Beta90
Angle Gamma90
Map-Model Fitting and Refinement
Id1 (4YUM)
Refinement SpaceRECIPROCAL
Refinement Protocol
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeTVIPS TEMCAM-F416 (4k x 4k)
Electron Dose (electrons/Å**2)0.06
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TALOS ARCTICA
Minimum Defocus (nm)
Maximum Defocus (nm)
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeDIFFRACTION
Specimen Holder Model
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)200
Imaging Details
EM Software
TaskSoftware PackageVersion
MODEL FITTINGPHENIXdev2880
MOLECULAR REPLACEMENTPHENIXdev2880
RECONSTRUCTIONPHENIXdev2880
MODEL REFINEMENTPHENIX1.16-3549
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
NONE