X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION, SITTING DROP7.529112% PEG 3350, 0.1 M Bis-Tris propane pH 8.5, 0.2 M NaNO3, 2% MPD, 8 mM n-Nonyl-b-D-thiomaltoside. The crystals were enhanced by the microseeding technique.
Crystal Properties
Matthews coefficientSolvent content
3.5965.7

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 167.852α = 90
b = 167.852β = 90
c = 519.99γ = 90
Symmetry
Space GroupI 4

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100PIXELDECTRIS PILATUS 6MKB focusing mirrors2014-06-04MSINGLE WAVELENGTH
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONALBA BEAMLINE XALOC0.979470ALBAXALOC

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)Rrim I (All)Rpim I (All)CC (Half)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
13.74099.80.1650.1820.0750.99610.15.844261776050
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R Merge I (Observed)Rrim I (All)Rpim I (All)CC (Half)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
13.73.7899.91.741.9060.7710.5816

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodStarting modelResolution (High)Resolution (Low)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONMOLECULAR REPLACEMENTTHROUGHOUT1DP03.74072328372099.780.24320.24110.2855RANDOM146.58
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
38.6738.67-77.34
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg30.051
r_dihedral_angle_4_deg15.251
r_dihedral_angle_3_deg13.934
r_dihedral_angle_1_deg7.269
r_angle_refined_deg1.444
r_angle_other_deg1.124
r_chiral_restr0.057
r_gen_planes_refined0.005
r_bond_refined_d0.004
r_bond_other_d0.003
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg30.051
r_dihedral_angle_4_deg15.251
r_dihedral_angle_3_deg13.934
r_dihedral_angle_1_deg7.269
r_angle_refined_deg1.444
r_angle_other_deg1.124
r_chiral_restr0.057
r_gen_planes_refined0.005
r_bond_refined_d0.004
r_bond_other_d0.003
r_gen_planes_other0.001
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms36112
Nucleic Acid Atoms
Solvent Atoms3
Heterogen Atoms4

Software

Software
Software NamePurpose
REFMACrefinement
PDB_EXTRACTdata extraction
XDSdata reduction
Aimlessdata scaling
MOLREPphasing