5SXF

Crystal Structure of PI3Kalpha in complex with fragment 9


X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION, HANGING DROP7298NaFormate
Crystal Properties
Matthews coefficientSolvent content
2.9758.55

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 112.346α = 90
b = 115.92β = 90
c = 147.185γ = 90
Symmetry
Space GroupP 21 21 21

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100PIXELDECTRIS PILATUS3 S 6M2014-10-17MSINGLE WAVELENGTH
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONALS BEAMLINE 5.0.21.0ALS5.0.2

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
13.4591.071000.11277.325565
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R Merge I (Observed)CC (Half)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
13.453.511000.9380.8187.4

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodStarting modelResolution (High)Resolution (Low)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONFOURIER SYNTHESISTHROUGHOUT4OVU3.4691.0724200131498.80.19830.19460.2668RANDOM127.991
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
4.561.13-5.69
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg37.663
r_dihedral_angle_3_deg19.063
r_dihedral_angle_4_deg15.095
r_mcangle_it12.718
r_mcbond_it8.16
r_mcbond_other8.147
r_dihedral_angle_1_deg7.257
r_angle_refined_deg1.483
r_angle_other_deg0.971
r_chiral_restr0.079
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg37.663
r_dihedral_angle_3_deg19.063
r_dihedral_angle_4_deg15.095
r_mcangle_it12.718
r_mcbond_it8.16
r_mcbond_other8.147
r_dihedral_angle_1_deg7.257
r_angle_refined_deg1.483
r_angle_other_deg0.971
r_chiral_restr0.079
r_bond_refined_d0.01
r_gen_planes_refined0.006
r_bond_other_d0.002
r_gen_planes_other0.002
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms9970
Nucleic Acid Atoms
Solvent Atoms
Heterogen Atoms12

Software

Software
Software NamePurpose
HKL-2000data collection
SCALEPACKdata scaling
REFMACrefinement
PDB_EXTRACTdata extraction
HKL-2000data reduction
REFMACphasing